Model temperature dependence of the imaginary ac susceptibility in simple and double superconducting structures

1992 ◽  
Vol 42 (10) ◽  
pp. 1025-1038 ◽  
Author(s):  
Ladislav Cesnak
2000 ◽  
Vol 215-216 ◽  
pp. 260-263 ◽  
Author(s):  
H Sassik ◽  
M Schönhart ◽  
R Grössinger ◽  
R Sato Turtelli ◽  
A Kottar

1997 ◽  
Vol 282-287 ◽  
pp. 1991-1992
Author(s):  
P.N. Mikheenko ◽  
J. Horvat ◽  
M. Ionescu ◽  
S.X. Dou

1989 ◽  
Vol 169 ◽  
Author(s):  
V. J. Melim ◽  
Weimin Peng ◽  
C.W. Kimball ◽  
B. Dabrowski ◽  
Y. Zheng ◽  
...  

AbstractEu2.xCexCuO4±δ (0 ≤ x ≤ 0.17) has been synthesized with the tetragonal T’ structure. AC susceptibility and resistance measurements show that Eu2‐xCexCuO4±δ becomes superconducting with τc∼13 K for x= 0.15 and 0.17, when prepared under reducing conditions. The 151Eu Mossbauer shift shows that the Euvalence falls into a narrow range near Eu 3+ . The temperature dependence of the Mossbauer absorption yields a Debye temperature of 319 K for the Eu ion in Eu1.85Ce0.15CuO4±δ


2010 ◽  
Vol 2010 ◽  
pp. 1-7 ◽  
Author(s):  
P. Pipinys ◽  
V. Lapeika

Temperature-dependent reverse-bias current-voltage characteristics obtained by other researchers for Schottky diodes fabricated on GaN are reinterpreted in terms of phonon-assisted tunneling (PhAT) model. Temperature dependence of reverse-bias leakage current is shown could be caused by the temperature dependence of electron tunneling rate from traps in the metal-semiconductor interface to the conduction band of semiconductor. A good fit of experimental data with the theory is received in a wide temperature range (from 80 K to 500 K) using for calculation the effective mass of 0.222 . and for the phonon energy the value of 70 meV. The temperature and bias voltages dependences of an apparent barrier height (activation energy) are also explicable in the framework of the PhAT model.


1985 ◽  
Vol 58 ◽  
Author(s):  
Esen E. Alp ◽  
S.K. Malik ◽  
Y. Lepetre ◽  
P.A. Montano ◽  
G.K. Shenoy

ABSTRACTThe structure and superconducting properties of rapidly quenched Zr—Ni and Zr—V alloys have been studied by XRD,EXAFS spectroscopy,TEM,electron diffraction,ED, electrical resistivity and ac susceptibility measurements. Amorphous Zr66Ni34 ribbons quenched with different cooling rates were also examined by flux pinning measurements. Characteristic differences are observed in the flux pinning mechanisms of microcrystalline and amorphous samples. The temperature dependence of upper critical fields have been measured down to 0.4 K and the results are analyzed in terms of WHH theory.


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