Adaptive on-line simulation of bioreactors: Fermentation monitoring and modeling system

1995 ◽  
Vol 14 (5) ◽  
pp. 403-411 ◽  
Author(s):  
Kaj Fagervik ◽  
Mikael Rydström ◽  
Randolf Schalien ◽  
Björn Saxén ◽  
Knut Ringbom ◽  
...  
Keyword(s):  
On Line ◽  
Fermentation Monitoring

Tandem mass spectrometry for on-line fermentation monitoring

1989 ◽  
Vol 3 (6) ◽  
pp. 361-364 ◽  
Author(s):  
Mark J. Hayward ◽  
Anita K. Lister ◽  
Tapio Kotiaho ◽  
R. Graham Cooks ◽  
Glen D. Austin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Tandem Mass Spectrometry ◽  
Tandem Mass ◽  
On Line ◽  
Fermentation Monitoring

On-Line Fermentation Monitoring by Mid-Infrared Spectroscopy

2004 ◽  
Vol 58 (7) ◽  
pp. 804-810 ◽  
Author(s):  
Gunta Mazarevica ◽  
Josef Diewok ◽  
Josefa R. Baena ◽  
Erwin Rosenberg ◽  
Bernhard Lendl
Keyword(s):  
Infrared Spectroscopy ◽  
Mid Infrared ◽  
Mid Infrared Spectroscopy ◽  
On Line ◽  
Fermentation Monitoring

Fermentation monitoring and control by on-line flow injection and liquid chromatography

1991 ◽  
Vol 249 (1) ◽  
pp. 87-100 ◽  
Author(s):  
K Schügerl ◽  
L Brandes ◽  
T Dullau ◽  
K Holzhauer-Rieger ◽  
S Hotop ◽  
...  
Keyword(s):  
Liquid Chromatography ◽  
Flow Injection ◽  
Monitoring And Control ◽  
Line Flow ◽  
On Line ◽  
Fermentation Monitoring ◽  
And Control

Development of an On-line Glucose Sensor for Fermentation Monitoring

Biosensors ◽  
1987 ◽  
Vol 3 (1) ◽  
pp. 45-56 ◽  
Author(s):  
Steven L. Brooks ◽  
Robert E. Ashby ◽  
Anthony P.F. Turner ◽  
Michael R. Calder ◽  
David J. Clarke
Keyword(s):  
Glucose Sensor ◽  
On Line ◽  
Fermentation Monitoring

scholarly journals On-Line fermentation monitoring using flow injection analysis

1990 ◽  
Vol 36 (6) ◽  
pp. 647-651 ◽  
Author(s):  
F. Valero ◽  
J. Lafuente ◽  
M. Poch ◽  
C. Solà ◽  
A. N. Araujo ◽  
...  
Keyword(s):  
Flow Injection ◽  
Flow Injection Analysis ◽  
On Line ◽  
Fermentation Monitoring

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

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