A complex of spectrochemical, mass-spectrometric and atomic-absorption methods for the analysis of thin layers of gallium arsenide and silicon semiconductors
1998 ◽
Vol 13
(9)
◽
pp. 983-987
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Keyword(s):
Keyword(s):
1998 ◽
Vol 361
(4)
◽
pp. 333-337
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1993 ◽
Vol 345
(8-9)
◽
pp. 575-578
◽
1984 ◽
Vol 159
◽
pp. 375-380
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1989 ◽
Vol 334
(2)
◽
pp. 148-153
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1988 ◽
Vol 330
(6)
◽
pp. 506-509
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1995 ◽
Vol 304
(3)
◽
pp. 317-321
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1994 ◽
Vol 350
(4-5)
◽
pp. 319-322
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