Effects of surface geometry in insulating films on the accuracy of thickness measurement with a contact instrument

1985 ◽  
Vol 28 (11) ◽  
pp. 951-953
Author(s):  
A. I. Sergeeva ◽  
Ya. M. Tseitlin
Keyword(s):  
Thickness Measurement ◽  
Surface Geometry ◽  
Insulating Films ◽  
Contact Instrument

Accuracy of MRI-Based Talar Cartilage Thickness Measurement and Talus Bone and Cartilage Modeling: Comparison with Ground-Truth Laser Scan Measurements

Cartilage ◽  
2020 ◽  
pp. 194760352097677
Author(s):  
Carly A. Lockard ◽  
Ingrid K. Stake ◽  
Alex W. Brady ◽  
Madeleine G. DeClercq ◽  
Kira K. Tanghe ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Three Dimensional ◽  
Ground Truth ◽  
Thickness Measurement ◽  
Cartilage Thickness ◽  
Patient Specific ◽  
Bone Surface ◽  
Joint Models ◽  
Surface Geometry ◽  
And Cartilage

Objective The purpose of this work was to compare measurements of talar cartilage thickness and cartilage and bone surface geometry from clinically feasible magnetic resonance imaging (MRI) against high-accuracy laser scan models. Measurement of talar bone and cartilage geometry from MRI would provide useful information for evaluating cartilage changes, selecting osteochondral graft sources or creating patient-specific joint models. Design Three-dimensional (3D) bone and cartilage models of 7 cadaver tali were created using (1) manual segmentation of high-resolution volumetric sequence 3T MR images and (2) laser scans. Talar cartilage thickness was compared between the laser scan– and MRI-based models for the dorsal, medial, and lateral surfaces. The laser scan– and MRI-based cartilage and bone surface models were compared using model-to-model distance. Results Average cartilage thickness within the dorsal, medial, and lateral surfaces were 0.89 to 1.05 mm measured with laser scanning, and 1.10 to 1.22 mm measured with MRI. MRI-based thickness was 0.16 to 0.32 mm higher on average in each region. The average absolute surface-to-surface differences between laser scan– and MRI-based bone and cartilage models ranged from 0.16 to 0.22 mm for bone (MRI bone models smaller than laser scan models) and 0.35 to 0.38 mm for cartilage (MRI bone models larger than laser scan models). Conclusions This study demonstrated that cartilage and bone 3D modeling and measurement of average cartilage thickness on the dorsal, medial, and lateral talar surfaces using MRI were feasible and provided similar model geometry and thickness values to ground-truth laser scan–based measurements.

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

Intima-media thickness measurement of the carotid artery in patients with primary hyperparathyroidism

2015 ◽  
Author(s):  
Dilek Tuzun ◽  
Ayten Oguz ◽  
Murat Sahin ◽  
Safa Ersen Ganidagli ◽  
Didem Atay ◽  
...  
Keyword(s):  
Carotid Artery ◽  
Primary Hyperparathyroidism ◽  
Intima Media Thickness ◽  
Thickness Measurement ◽  
Media Thickness

Perceived Glossiness: Beyond Surface Properties

2019 ◽  
Vol 2019 (1) ◽  
pp. 37-42
Author(s):  
Davit Gigilashvili ◽  
Jean-Baptiste Thomas ◽  
Marius Pedersen ◽  
Jon Yngve Hardeberg
Keyword(s):  
Surface Properties ◽  
Human Subjects ◽  
Surface Geometry ◽  
Surface Reflection ◽  
Different Color

Gloss is widely accepted as a surface- and illuminationbased property, both by definition and by means of metrology. However, mechanisms of gloss perception are yet to be fully understood. Potential cues generating gloss perception can be a product of phenomena other than surface reflection and can vary from person to person. While human observers are less likely to be capable of inverting optics, they might also fail predicting the origin of the cues. Therefore, we hypothesize that color and translucency could also impact perceived glossiness. In order to validate our hypothesis, we conducted series of psychophysical experiments asking observers to rank objects by their glossiness. The objects had the identical surface geometry and shape but different color and translucency. The experiments have demonstrated that people do not perceive objects with identical surface equally glossy. Human subjects are usually able to rank objects of identical surface by their glossiness. However, the strategy used for ranking varies across the groups of people.

Silicon Fringe Sample Metrology—A Thickness Measurement Technique

2013 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Temperature Dependence ◽  
Temperature Coefficient ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Sample Thickness ◽  
Index Of Refraction ◽  
Interference Fringes ◽  
Noncontact Method ◽  
Thickness Variations

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).

Application of EDS Technique for OSP Film Thickness Measurement

2006 ◽  
Author(s):  
Prong Kongsubto ◽  
Sirarat Kongwudthiti
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Joint Strength ◽  
Critical Factor ◽  
Thickness Measurement ◽  
Ic Manufacturing ◽  
And Control ◽  
Film Thickness Measurement ◽  
Non Destructive

Abstract Organic solderability preservatives (OSPs) pad is one of the pad finishing technologies where Cu pad is coated with a thin film of an organic material to protect Cu from oxidation during storage and many processes in IC manufacturing. Thickness of OSP film is a critical factor that we have to consider and control in order to achieve desirable joint strength. Until now, no non-destructive technique has been proposed to measure OSP thickness on substrate. This paper reports about the development of EDS technique for estimating OSP thickness, starting with determination of the EDS parameter followed by establishing the correlation between C/Cu ratio and OSP thickness and, finally, evaluating the accuracy of the EDS technique for OSP thickness measurement. EDS quantitative analysis was proved that it can be utilized for OSP thickness estimation.

Impacts of Sample Preparation Methodology on TEM Failure Analysis of Advanced Semiconductor Devices

2011 ◽  
Author(s):  
Yongkai Zhou ◽  
Jie Zhu ◽  
Han Wei Teo ◽  
ACT Quah ◽  
Lei Zhu ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Case Studies ◽  
Thickness Measurement ◽  
Interface Roughness ◽  
Silicide Formation ◽  
Cross Sectional ◽  
Inspection Method ◽  
Low Mass

Abstract In this paper, two failure analysis case studies are presented to demonstrate the importance of sample preparation procedures to successful failure analyses. Case study 1 establishes that Palladium (Pd) cannot be used as pre-FIB coating for SiO2 thickness measurement due to the spontaneously Pd silicide formation at the SiO2/Si interface. Platinum (Pt) is thus recommended, in spite of the Pt/SiO2 interface roughness, as the pre-FIB coating in this application. In the second case study, the dual-directional TEM inspection method is applied to characterize the profile of the “invisible” tungsten residue defect. The tungsten residue appears invisible in the planeview specimen due to the low mass-thickness contrast. It is then revealed in the cross-sectional TEM inspection.

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