Influence of specular reflection component of surfaces on the radiation characteristics of a herringbone cavity

1979 ◽  
Vol 37 (1) ◽  
pp. 859-863
Author(s):  
A. I. Skovorodkin
Author(s):  
Kumiko Kikuchi ◽  
Shoji Tominaga ◽  
Jon Y. Hardeberg

We have developed a system to measure both the optical properties of facial skin and the three-dimensional shape of the face. To measure the three-dimensional facial shape, our system uses a light-field camera to provide a focused image and a depth image simultaneously. The light source uses a projector that produces a high-frequency binary illumination pattern to separate the subsurface scattering and surface reflections from the facial skin. Using a dichromatic reflection model, the surface reflection image of the skin can be separated further into a specular reflection component and a diffuse reflection component. Verification using physically controlled objects showed that the separation of the optical properties by the system correlated with the subsurface scattering, specular reflection, or diffuse reflection characteristics of each object. The method presented here opens new possibilities in cosmetology and skin pharmacology for measurement of the skin’s gloss and absorption kinetics and the pharmacodynamics of various external agents.


1993 ◽  
Vol 47 (6) ◽  
pp. 687-694 ◽  
Author(s):  
Jill M. Olinger ◽  
Peter R. Griffiths

The mid- and near-infrared diffuse reflection spectra of three carbohydrates—microcrystalline cellulose, wheat starch, and sucrose—are examined to determine whether dilution is necessary in either spectral region in order to avoid the effects of specular reflection. As expected, it was found that dilution was not necessary to obtain valid diffuse reflection spectra of samples in the near-infrared, but that dilution was necessary for measuring mid-infrared diffuse reflection spectra free of the effects of specular reflection. The effects of particle size and sample morphology were investigated for sucrose crystals up to 2 mm in dimension. Depending upon the particle size and orientation, the effects of specular reflection can be observed in both near- and mid-infrared diffuse reflection spectra of sucrose. Surface roughness can allow a diffuse reflection component to be measured in the spectra of very large particles where a specular reflection mechanism would typically be expected to predominate.


Author(s):  
Yusuke Manabe ◽  
Midori Tanaka ◽  
Takahiko Horiuchi

With the proliferation of smartphones and social networking services, the opportunities for individuals to take photographs have increased exponentially. In a previous study, the perceived gloss of an object was reduced by its representing as a digital image and compared with a real object. It is also known that image editing, such as lossy image compression, can reduce the glossiness of an image. Therefore, the glossiness of real objects may be easily changed in digital images; thus, a method for appropriately editing the gloss in digital images is required for post-processing. In this study, we propose a gloss appearance editing method for various material objects in a single digital image. The proposed method consists of three steps: color space conversion, gloss detection, and gloss editing. The relationship between the proposed method and the respective reflection models of inhomogeneous objects, metallic objects, and translucent objects was analyzed. Consequently, we determined that the gloss editing of the proposed method is equivalent to editing the specular reflection component of an inhomogeneous object, the grazing reflection component of a metallic object, and the specular reflection component of a translucent object. We applied the proposed method to test images including objects of various materials and confirmed its effectiveness through a subjective evaluation by visual inspection and an objective evaluation using image statistics.


Author(s):  
Edward G. Bartick ◽  
John A. Reffner

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.


Author(s):  
J. Liu ◽  
J. M. Cowley

The low energy loss region of a EELS spectrum carries information about the valence electron excitation processes (e.g., collective excitations for free electron like materials and interband transitions for insulators). The relative intensities and the positions of the interband transition energy loss peaks observed in EELS spectra are determined by the joint density of states (DOS) of the initial and final states of the excitation processes. Thus it is expected that EELS in reflection mode could yield information about the perturbation of the DOS of the conduction and valence bands of the bulk crystals caused by the termination of the three dimensional periodicity at the crystal surfaces. The experiments were performed in a Philipps 400T transmission electron microscope operated at 120 kV. The reflection EELS spectra were obtained by a Gatan 607 EELS spectrometer together with a Tracor data acquisition system and the resolution of the spectrometer was about 0.8 eV. All the reflection spectra are obtained from the specular reflection spots satisfying surface resonance conditions.


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