Determination of the systematic measuring error of scattering parameters of shf transistors as six-terminal networks
2011 ◽
Vol 8
(6)
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pp. 603-609
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1981 ◽
Vol IM-30
(3)
◽
pp. 198-201
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Keyword(s):
Keyword(s):
2016 ◽
Vol 64
(8)
◽
pp. 3459-3469
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Keyword(s):