Possibility of isotopic analysis of lithium using an inductively coupled plasma and a selective interference spectrometer

1986 ◽  
Vol 44 (1) ◽  
pp. 10-14
Author(s):  
L. V. Egorova ◽  
M. A. Kartasheva ◽  
I. E. Leshcheva ◽  
M. E. Sidorenko
Keyword(s):  
Inductively Coupled Plasma ◽  
Isotopic Analysis ◽  
Inductively Coupled ◽  
Selective Interference ◽  
Interference Spectrometer

scholarly journals Isotope analysis of highly enriched “silicon-28” by high-resolution inductively coupled plasma mass spectrometry using an internal standard

2021 ◽  
Vol 25 (2) ◽  
pp. 98-109
Author(s):  
P. A. Otopkova ◽  
◽  
A. M. Potapov ◽  
A. I. Suchkov ◽  
A. D. Bulanov ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Matrix Element ◽  
High Resolution ◽  
Inductively Coupled Plasma ◽  
Internal Standard ◽  
Isotopic Analysis ◽  
Random Component ◽  
Inductively Coupled ◽  
The Matrix ◽  
Plasma Mass Spectrometry

In order to study the isotopic effects in semiconductor materials, single crystals of high chemical and isotopic purity are required. The reliability of the obtained data on the magnitude and the direction of isotopic shifts depends on the accuracy of determining the concentration of all stable isotopes. In the isotopic analysis of enriched “silicon-28” with a high degree of enrichment (> 99.99%), it is necessary to determine the impurities of 29Si and 30Si isotopes at the level of 10-3 ¸ 10-5 at. %. At this concentration level, these isotopes can be considered as impurities. It is difficult to achieve high measurement accuracy with simultaneous registration of the main and “impurity” isotopes in such a wide range of concentrations. The registration of analytical signals of silicon isotopes must be carried out in the solutions with different matrix concentrations. The use of the solutions with the high concentration of the matrix element requires the introduction of corrections for matrix noise and the drift of the instrument sensitivity during the measurement. It is possible to reduce the influence of the irreversible non-spectral interference and sensitivity drift by using the method of internal standardization. The inconsistency of the literature data on the selection criteria for the internal standard required studying the behavior of the signals of the “candidates for the internal standard” for the ELEMENT 2 single-collector high-resolution inductively coupled plasma mass spectrometer on the matrix element concentration and the nature of the solvent, as well as on the solution nebulizing time. Accounting for the irreversible non-spectral matrix noise and instrumental drift in isotopic analysis of enriched “silicon-28” and initial 28SiF4 by inductively coupled plasma mass spectrometry had allowed us to reduce by 3-5 times the random component and by more than an order of magnitude the systematic component of the measurement error in comparison with the external standard method. This made it possible to carry out, with sufficient accuracy, the operational control of the isotopic composition of enriched “silicon-28”, both in the form of silicon tetrafluoride and polycrystalline silicon obtained from it, using a single serial device in the range of isotopic concentrations 0.0001–99.999%.

Determination of isotope fractionation of Cr(iii) during oxidation by LC/low-resolution MC-ICPMS

2020 ◽  
Vol 35 (3) ◽  
pp. 560-566
Author(s):  
Jakub Karasiński ◽  
Cuc Thi Nguyen-Marcińczyk ◽  
Marcin Wojciechowski ◽  
Ewa Bulska ◽  
Ludwik Halicz
Keyword(s):  
Inductively Coupled Plasma ◽  
Isotope Fractionation ◽  
Isotopic Analysis ◽  
Reversed Phase ◽  
Ion Pair ◽  
Reversed Phase Chromatography ◽  
Inductively Coupled ◽  
Plasma Mass Spectrometry ◽  
Sensitive Method

A robust and sensitive method for the precise isotopic analysis of 53Cr/50Cr during Cr(iii) oxidation by coupling ion pair reversed-phase chromatography and Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS) is presented.

Iron isotopic analysis of finger-prick and venous blood by multi-collector inductively coupled plasma-mass spectrometry after volumetric absorptive microsampling

2017 ◽  
Vol 32 (2) ◽  
pp. 314-321 ◽  
Author(s):  
Yulia Anoshkina ◽  
Marta Costas-Rodríguez ◽  
Frank Vanhaecke
Keyword(s):  
Mass Spectrometry ◽  
High Precision ◽  
Whole Blood ◽  
Inductively Coupled Plasma ◽  
Venous Blood ◽  
Isotopic Analysis ◽  
Inductively Coupled ◽  
Finger Prick ◽  
Plasma Mass Spectrometry ◽  
Volumetric Absorptive Microsampling

The use of VAMS – volumetric absorptive microsampling – of finger-prick blood was evaluated in the context of high-precision isotopic analysis of whole blood Fe by multi-collector inductively coupled plasma-mass spectrometry.

scholarly journals Direct analysis of dried blood spots by femtosecond-laser ablation-inductively coupled plasma-mass spectrometry. Feasibility of split-flow laser ablation for simultaneous trace element and isotopic analysis

2015 ◽  
Vol 30 (1) ◽  
pp. 296-309 ◽  
Author(s):  
M. Aramendía ◽  
L. Rello ◽  
S. Bérail ◽  
A. Donnard ◽  
C. Pécheyran ◽  
...  
Keyword(s):  
Laser Ablation ◽  
Inductively Coupled Plasma ◽  
Femtosecond Laser Ablation ◽  
Direct Analysis ◽  
Isotopic Analysis ◽  
Dried Blood Spots ◽  
Blood Spots ◽  
Inductively Coupled ◽  
Split Flow ◽  
Plasma Mass Spectrometry

This work presents a method that enables the direct elemental and isotopic analysis of dried blood spots using LA-ICPMS.

On-line separation of strontium from a matrix and determination of the 87Sr/86Sr ratio by Ion Chromatography/Multicollector-ICPMS

2016 ◽  
Vol 31 (7) ◽  
pp. 1459-1463 ◽  
Author(s):  
Jakub Karasinski ◽  
Ewa Bulska ◽  
Marcin Wojciechowski ◽  
Agnieszka Anna Krata ◽  
Ludwik Halicz
Keyword(s):  
Ion Chromatography ◽  
Inductively Coupled Plasma ◽  
Isotopic Analysis ◽  
86Sr Ratio ◽  
Inductively Coupled ◽  
Plasma Mass Spectrometry ◽  
On Line ◽  
Line Separation ◽  
Sensitive Method

In this work a high throughput, robust and sensitive method for the precise isotopic analysis of 87Sr/86Sr by coupling Ion Chromatography (IC) and Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS) is presented.

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