High-temperature x-ray investigation of the isothermal transformation of austenite in high-speed steels

1967 ◽  
Vol 9 (9) ◽  
pp. 676-680 ◽  
Author(s):  
V. A. Landa ◽  
E. M. Stepnov
Keyword(s):  
High Temperature ◽  
High Speed ◽  
Isothermal Transformation ◽  
X Ray

Modification of Asphalt by Montmorillonite

2011 ◽  
Vol 84-85 ◽  
pp. 662-666 ◽  
Author(s):  
Zeng Ping Zhang ◽  
Yong Wen ◽  
Jian Zhong Pei ◽  
Shuan Fa Chen
Keyword(s):  
High Temperature ◽  
Low Temperature ◽  
Temperature Sensitivity ◽  
Softening Point ◽  
High Speed ◽  
Melt Blending ◽  
X Ray Diffraction ◽  
Nanocomposite Structure ◽  
X Ray ◽  
Temperature Performance

Montmorillonite (MMT) modified asphalts are prepared by melt blending with the help of high-speed shear mixer. The dispersion of MMT layers in the asphalt matrix are characterized by X-ray diffraction (XRD). The effect of different contents of MMT on physical properties of the base asphalt is studied. These properties include penetration, softening point and ductility. The results indicate that MMT/asphalt may form a nanocomposite structure with MMT layers intercalated by the asphalt molecules. MMT can improve the high temperature performance and temperature sensitivity of the base asphalt. And it can slightly reduce the low temperature performances of matrix asphalt. It is found that low temperature performances, high temperature performance and temperature sensitivity of the modified system achieved balance when the content of MMT is 4 wt%.

scholarly journals Quantitative 4D X-ray microtomography under extreme conditions: a case study on magma migration

2021 ◽  
Vol 28 (5) ◽  
Author(s):  
Elena Giovenco ◽  
Jean-Philippe Perrillat ◽  
Eglantine Boulard ◽  
Andrew King ◽  
Nicolas Guignot ◽  
...  
Keyword(s):  
Computed Tomography ◽  
High Pressure ◽  
High Temperature ◽  
High Speed ◽  
High Efficiency ◽  
Morphological Properties ◽  
Extreme Conditions ◽  
Temporal Dimension ◽  
Angular Aperture ◽  
X Ray

X-ray computed tomography (XCT) is a well known method for three-dimensional characterization of materials that is established as a powerful tool in high-pressure/high-temperature research. The optimization of synchrotron beamlines and the development of fast high-efficiency detectors now allow the addition of a temporal dimension to tomography studies under extreme conditions. Presented here is the experimental setup developed on the PSICHE beamline at SOLEIL to perform high-speed XCT in the Ultra-fast Tomography Paris–Edinburgh cell (UToPEc). The UToPEc is a compact panoramic (165° angular aperture) press optimized for fast tomography that can access 10 GPa and 1700°C. It is installed on a high-speed rotation stage (up to 360° s−1) and allows the acquisition of a full computed tomography (CT) image with micrometre spatial resolution within a second. This marks a major technical breakthrough for time-lapse XCT and the real-time visualization of evolving dynamic systems. In this paper, a practical step-by-step guide to the use of the technique is provided, from the collection of CT images and their reconstruction to performing quantitative analysis, while accounting for the constraints imposed by high-pressure and high-temperature experimentation. The tomographic series allows the tracking of key topological parameters such as phase fractions from 3D volumetric data, and also the evolution of morphological properties (e.g. volume, flatness, dip) of each selected entity. The potential of this 4D tomography is illustrated by percolation experiments of carbonate melts within solid silicates, relevant for magma transfers in the Earth's mantle.

Microstructural transformations and kinetics of high-temperature heterogeneous gasless reactions by high-speed x-ray phase-contrast imaging

2009 ◽  
Vol 80 (22) ◽  
Author(s):  
Robert V. Reeves ◽  
Jeremiah D. E. White ◽  
Eric M. Dufresne ◽  
Kamel Fezzaa ◽  
Steven F. Son ◽  
...  
Keyword(s):  
High Temperature ◽  
High Speed ◽  
Phase Contrast ◽  
Phase Contrast Imaging ◽  
Contrast Imaging ◽  
X Ray ◽  
Kinetics Of

Investigation on oxidation behaviors of Ti-Si-N coating at high temperature

2018 ◽  
Vol 65 (2) ◽  
pp. 125-130 ◽  
Author(s):  
Q. Wan ◽  
Y.M. Chen ◽  
H.D. Liu ◽  
B. Yang
Keyword(s):  
High Temperature ◽  
High Speed ◽  
Structure Evolution ◽  
Temperature Oxidation ◽  
Arc Ion Plating ◽  
Content Type ◽  
X Ray ◽  
Ion Plating ◽  
Alloy Target ◽  
Cathodic Arc

Purpose Ti-Si-N coating with nanocomposite structure is a promising protective coating for cutting tools which will be subject to high temperature oxidation during service. This study aims to investigate the thermal stability of Ti-Si-N coatings and lays the foundation for its application in high speed dry cutting. Design/methodology/approach Nanocomposite Ti-Si-N coating was deposited on stainless substrate and silicon wafer (100) by Ti90Si10 alloy target by using cathodic arc ion plating. The microstructure of Ti-Si-N coating had been detected by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). Findings The results suggested that the coating was TiN nanocrystals with a diameter of 6.3 nm surrounded by amorphous Si3N4. The oxidation test was conducted under 550, 650, 750, 800, 850, 900 and 950°C for 2 h. The structure evolution was observed by Scanning electron microscope (SEM), energy dispersive spectrum (EDS), XRD and XPS. The results indicated that rutile has been formed at 650°C, while Si3N4 began to oxidized at 800°C. The grain size of TiN increased from 6.3 to 13 nm as the samples oxidized from 550 to 800. Micro-crack also formed in samples oxidized over 900°C. Originality/value Ti-Si-N coating, in this study, was deposited by cathodic arc ion plating using alloy target at high-bias voltage. The oxidation temperature ranged from 500 to 950°C with TiN coating as reference.

Phase transformation study of a high speed steel powder by high temperature X-ray diffraction

2008 ◽  
Vol 59 (7) ◽  
pp. 937-943 ◽  
Author(s):  
Manfred Wieβner ◽  
Manfred Leisch ◽  
Herbert Emminger ◽  
Alfred Kulmburg
Keyword(s):  
Phase Transformation ◽  
High Temperature ◽  
High Speed ◽  
High Speed Steel ◽  
Steel Powder ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transformation Study

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

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