Wavelength tuning of the emission of a thin-film DFB laser by varying the index of refraction of the boundary medium

1981 ◽  
Vol 34 (2) ◽  
pp. 157-160
Author(s):  
V. I. Borişov ◽  
V. I. Lebedev
Keyword(s):  
Thin Film ◽  
Index Of Refraction ◽  
Wavelength Tuning ◽  
Dfb Laser

Quantum cascade laser wavelength tuning due to temperature-dependent index of refraction

2012 ◽  
Author(s):  
Asif Ahmed ◽  
Orchi Hassan ◽  
Md. Shahadat Hasan Sohel ◽  
Fariah Hayee ◽  
Rafatul Faria ◽  
...  
Keyword(s):  
Quantum Cascade Laser ◽  
Laser Wavelength ◽  
Index Of Refraction ◽  
Wavelength Tuning ◽  
Temperature Dependent ◽  
Quantum Cascade

scholarly journals Enlargement of the organic solid-state DFB laser wavelength tuning range by the use of two complementary luminescent dyes doped into the host matrix

2017 ◽  
Vol 19 (27) ◽  
pp. 18068-18075 ◽  
Author(s):  
Kacper Parafiniuk ◽  
Lech Sznitko ◽  
Dominika Wawrzynczyk ◽  
Andrzej Miniewicz ◽  
Jaroslaw Mysliwiec
Keyword(s):  
Solid State ◽  
Tuning Range ◽  
Laser Wavelength ◽  
Polymeric Matrix ◽  
Wavelength Tuning ◽  
Molecular Aggregates ◽  
Host Matrix ◽  
Organic Solid ◽  
Dfb Laser ◽  
Organic Solid State

Broad range tunable DFB lasing was achieved by the utilization of two dyes forming molecular aggregates within the polymeric matrix.

scholarly journals Obliquely Bideposited TiN Thin Film with Morphology-Dependent Optical Properties

Coatings ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 1418
Author(s):  
Yi-Jun Jen ◽  
Wei-Chieh Ma ◽  
Ting-Yen Lin
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Extinction Coefficient ◽  
Normal Incidence ◽  
Columnar Structure ◽  
Index Of Refraction ◽  
Tin Film ◽  
Tin Thin Films ◽  
Visible Wavelengths ◽  
Incident Cases

TiN thin films were obliquely bideposited with different subdeposit thicknesses. The morphology of the bideposited film was varied from a nano-zigzag array to a vertically grown columnar structure by reducing the subdeposit thickness. The principal index of refraction and extinction coefficient were obtained to explain the measured reflectance and transmittance spectra. The loss of the bideposited thin film decreased as the thickness of the subdeposit decreased. The principal indices for normal incidence were near or under unity, indicating the low reflection by the bideposited thin films. A TiN film with a subdeposit thickness of 3 nm demonstrated an average index of refraction of 0.83 and extinction coefficient of below 0.2 for visible wavelengths. The retrieved principal refractive indexes explained the anisotropic transmission and reflection. For most normal incident cases, the analysis offers the tunable anisotropic property of a TiN nanostructured film for multilayer design in the future.

Surface measurement of indium tin oxide thin film by wavelength-tuning Fizeau interferometry

2015 ◽  
Vol 54 (23) ◽  
pp. 7135 ◽  
Author(s):  
Yangjin Kim ◽  
Kenichi Hibino ◽  
Naohiko Sugita ◽  
Mamoru Mitsuishi
Keyword(s):  
Thin Film ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Wavelength Tuning ◽  
Oxide Thin Film ◽  
Surface Measurement
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