Use of emission microspectral analysis to investigate distribution of elements in titanium alloys

1978 ◽  
Vol 28 (1) ◽  
pp. 24-28
Author(s):  
E. S. Orlova ◽  
L. F. Sokiryanskii ◽  
T. E. Stanevich
Author(s):  
N. E. Paton ◽  
D. de Fontaine ◽  
J. C. Williams

The electron microscope has been used to study the diffusionless β → β + ω transformation occurring in certain titanium alloys at low temperatures. Evidence for such a transformation was obtained by Cometto et al by means of x-ray diffraction and resistivity measurements on a Ti-Nb alloy. The present work shows that this type of transformation can occur in several Ti alloys of suitable composition, and some of the details of the transformation are elucidated by means of direct observation in the electron microscope.Thin foils were examined in a Philips EM-300 electron microscope equipped with a uniaxial tilt, liquid nitrogen cooled, cold stage and a high resolution dark field device. Selected area electron diffraction was used to identify the phases present and the ω-phase was imaged in dark field by using a (101)ω reflection. Alloys were water quenched from 950°C, thinned, and mounted between copper grids to minimize temperature gradients in the foil.


Author(s):  
Shiro Fujishiro ◽  
Harold L. Gegel

Ordered-alpha titanium alloys having a DO19 type structure have good potential for high temperature (600°C) applications, due to the thermal stability of the ordered phase and the inherent resistance to recrystallization of these alloys. Five different Ti-Al-Ga alloys consisting of equal atomic percents of aluminum and gallium solute additions up to the stoichiometric composition, Ti3(Al, Ga), were used to study the growth kinetics of the ordered phase and the nature of its interface.The alloys were homogenized in the beta region in a vacuum of about 5×10-7 torr, furnace cooled; reheated in air to 50°C below the alpha transus for hot working. The alloys were subsequently acid cleaned, annealed in vacuo, and cold rolled to about. 050 inch prior to additional homogenization


Author(s):  
G. Das ◽  
R. E. Omlor

Fiber reinforced titanium alloys hold immense potential for applications in the aerospace industry. However, chemical reaction between the fibers and the titanium alloys at fabrication temperatures leads to the formation of brittle reaction products which limits their development. In the present study, coated SiC fibers have been used to evaluate the effects of surface coating on the reaction zone in the SiC/IMI829 system.IMI829 (Ti-5.5A1-3.5Sn-3.0Zr-0.3Mo-1Nb-0.3Si), a near alpha alloy, in the form of PREP powder (-35 mesh), was used a茸 the matrix. CVD grown AVCO SCS-6 SiC fibers were used as discontinuous reinforcements. These fibers of 142μm diameter contained an overlayer with high Si/C ratio on top of an amorphous carbon layer, the thickness of the coating being ∽ 1μm. SCS-6 fibers, broken into ∽ 2mm lengths, were mixed with IMI829 powder (representing < 0.1vol%) and the mixture was consolidated by HIP'ing at 871°C/0. 28GPa/4h.


Author(s):  
G. Botton ◽  
G. L’Espérance ◽  
M.D. Ball ◽  
C.E. Gallerneault

The recently developed parallel electron energy loss spectrometers (PEELS) have led to a significant reduction in spectrum acquisition time making EELS more useful in many applications in material science. Dwell times as short as 50 msec per spectrum with a PEELS coupled to a scanning transmission electron microscope (STEM), can make quantitative EEL images accessible. These images would present distribution of elements with the high spatial resolution inherent to EELS. The aim of this paper is to briefly investigate the effect of acquisition time per pixel on the signal to noise ratio (SNR), the effect of thickness variation and crystallography and finally the energy stability of spectra when acquired in the scanning mode during long periods of time.The configuration of the imaging system is the following: a Gatan PEELS is coupled to a CM30 (TEM/STEM) electron microscope, the control of the spectrometer and microscope is performed through a LINK AN10-85S MCA which is interfaced to a IBM RT 125 (running under AIX) via a DR11W line.


Author(s):  
E. Sukedai ◽  
M. Shimoda ◽  
A. Fujita ◽  
H. Nishizawa ◽  
H. Hashimoto

ω-phase particles formed in β-titanium alloys (bcc structure) act important roles to their mechanical properties such as ductility and hardness. About the ductility, fine ω-phase particles in β–titanium alloys improve the ductility, because ω-phase crystals becomes nucleation sites of α-phase and it is well known that (β+α) duplex alloys have higher ductility. In the present study, the formation sites and the formation mechanism of ω-phase crystals due to external stress and aging are investigated using the conventional and high resolution electron microscopy.A β-titanium alloy (Til5Mo5Zr) was supplied by Kobe Steel Co., and a single crystal was prepared by a zone refining method. Plates with {110} surface were cut from the crystal and were pressured hydrostatically, and stressed by rolling and tensile testing. Specimens for aging with tensile stress were also prepared from Ti20Mo polycrystals. TEM specimens from these specimens were prepared by a twin-jet electron-polishing machine. A JEM 4000EX electron microscope operated at 400k V was used for taking dark field and HREM images.


Author(s):  
Judith M. Brock ◽  
Max T. Otten

A knowledge of the distribution of chemical elements in a specimen is often highly useful. In materials science specimens features such as grain boundaries and precipitates generally force a certain order on mental distribution, so that a single profile away from the boundary or precipitate gives a full description of all relevant data. No such simplicity can be assumed in life science specimens, where elements can occur various combinations and in different concentrations in tissue. In the latter case a two-dimensional elemental-distribution image is required to describe the material adequately. X-ray mapping provides such of the distribution of elements.The big disadvantage of x-ray mapping hitherto has been one requirement: the transmission electron microscope must have the scanning function. In cases where the STEM functionality – to record scanning images using a variety of STEM detectors – is not used, but only x-ray mapping is intended, a significant investment must still be made in the scanning system: electronics that drive the beam, detectors for generating the scanning images, and monitors for displaying and recording the images.


2018 ◽  
Vol 12 (9) ◽  
pp. 771
Author(s):  
Yuliia Borisovna Egorova ◽  
Liudmila Vasilevna Davydenko ◽  
Evgeniy Nikolaevich Egorov ◽  
Evgeniy Valeryevna Chibisova

Author(s):  
Magna Bibiano de Oliveira ◽  
Alexandra de Oliveira França Hayama ◽  
Rubens Toledo

Sign in / Sign up

Export Citation Format

Share Document