Optical constants of?-SiC(6H) in the intrinsic absorption region

1971 ◽  
Vol 15 (1) ◽  
pp. 959-961
Author(s):  
V. A. Obarich
Keyword(s):  
Optical Constants ◽  
Absorption Region ◽  
Intrinsic Absorption

Ellipsometric determination of the optical constants of glassy As2S3 thin films in the weak absorption region

2006 ◽  
Vol 101 (4) ◽  
pp. 568-570 ◽  
Author(s):  
M. I. Kozak ◽  
V. N. Zhikharev ◽  
I. P. Studenyak ◽  
I. D. Seĭkovskĭ
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Absorption Region ◽  
Weak Absorption

Development of 200kV ultrahigh-resolution analytical electron microscope

1989 ◽  
Vol 47 ◽  
pp. 108-109
Author(s):  
T. Kaneyama ◽  
M. Naruse ◽  
Y. Ishida ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Optical Constants ◽  
Materials Science ◽  
Objective Lens ◽  
The Finite Element Method ◽  
Ultrahigh Resolution ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Characteristic Features ◽  
Better Than

In the field of materials science, the importance of the ultrahigh resolution analytical electron microscope (UHRAEM) is increasing. A new UHRAEM which provides a resolution of better than 0.2 nm and allows analysis of a few nm areas has been developed. [Fig. 1 shows the external view] The followings are some characteristic features of the UHRAEM.Objective lens (OL)Two types of OL polepieces (URP for ±10' specimen tilt and ARP for ±30' tilt) have been developed. The optical constants shown in the table on the next page are figures calculated by the finite element method. However, Cs was experimentally confirmed by two methods (namely, Beam Tilt method and Krivanek method) as 0.45 ∼ 0.50 mm for URP and as 0.9 ∼ 1.0 mm for ARP, respectively. Fig. 2 shows an optical diffractogram obtained from a micrograph of amorphous carbon with URP under the Scherzer defocus condition. It demonstrates a resolution of 0.19 nm and a Cs smaller than 0.5 mm.

OPTICAL CONSTANTS OF LAYER STRUCTURES FROM ELLIPSOMETRIC DATA

1983 ◽  
Vol 44 (C10) ◽  
pp. C10-31-C10-34
Author(s):  
S. Logothetidis ◽  
J. Spyridelis
Keyword(s):  
Optical Constants ◽  
Layer Structures
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