Magnetic parameters of ferrite inclusions observed in magnesium oxide substrates used in nickel ferrite film growth

1975 ◽  
Vol 10 (10) ◽  
pp. 1830-1831 ◽  
Author(s):  
A. O. Tooke
1995 ◽  
Vol 02 (01) ◽  
pp. 109-126 ◽  
Author(s):  
ROBERT J. LAD

This article reviews aspects of the electronic, chemical, and structural properties of metal/oxide and oxide/oxide interfaces which are formed via ultrathin film growth on oxide single-crystal surfaces. The interactions at the interfaces are classified based on the nature of the reaction products, thermodynamic predictions of interfacial reactions, and wetting and adhesion. Then, properties of single-crystal oxide substrates and limitations and difficulties in studying these ceramic systems are discussed. The remainder of the article presents experimental observations for several systems involving both metal and oxide ultrathin film growth on stoichiometric NiO (100), TiO 2(110), and [Formula: see text] surfaces including a discussion of interdiffusion, chemical and electronic interactions, thermal stability, and interfacial impurity effects.


2018 ◽  
Vol 442 ◽  
pp. 148-155 ◽  
Author(s):  
Chuan Li ◽  
Qi Li ◽  
Hui Cao ◽  
Guanghui Leng ◽  
Yongliang Li ◽  
...  

2003 ◽  
Vol 399 (3-4) ◽  
pp. 107-119 ◽  
Author(s):  
S Köbel ◽  
D Schneider ◽  
D Sager ◽  
P Sütterlin ◽  
L Fall ◽  
...  

2005 ◽  
Vol 902 ◽  
Author(s):  
George H. Thomas ◽  
Jonathan S. Morrell ◽  
Tolga Aytug ◽  
Ziling B. Xue ◽  
David B. Beach

AbstractEpitaxial films of strontium bismuth tantalate (SrBi2Ta2O9, SBT) and strontium bismuth niobate (SrBi2Nb2O9, SBN) were grown using solution deposition techniques on magnesium oxide (MgO) substrates buffered with a 100 nm layer of lanthanum manganate (LaMnO3, LMO). Film structure and texture analyses were carried out using x-ray diffraction. Theta-2theta diffraction patterns were consistent with a c-axis aligned structure for both the buffer layer and the solution deposited films. Theta-2 theta scans revealed (001)SBT, SBN //(001) LMO epitaxial relationships between the solution deposited films and the buffer layer. A pole figure about the SBT, SBN (115) reflection indicated a single in-plane epitaxy. Film quality was assessed using ω and φ scans. Nuclear Magnetic Resonance (13C) was used to characterized the methoxy-ethoxide solutions used for the deposition of the SBN and SBT films.


2013 ◽  
Vol 114 (9) ◽  
pp. 093704 ◽  
Author(s):  
Takeshi Ohgaki ◽  
Ken Watanabe ◽  
Yutaka Adachi ◽  
Isao Sakaguchi ◽  
Shunichi Hishita ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document