Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films

1981 ◽  
Vol 16 (8) ◽  
pp. 2281-2286 ◽  
Author(s):  
C. R. Tellier ◽  
C. R. Pichard ◽  
A. J. Tosser
Keyword(s):  
Three Dimensional ◽  
Metal Films ◽  
Polycrystalline Metal ◽  
Thin Polycrystalline

scholarly journals Three Dimensional Analytical Separation of Grain Boundary and Surface Scatterings in Polycrystalline Metal Films in the Case of Non Cubic Grains

1981 ◽  
Vol 9 (2) ◽  
pp. 125-130 ◽  
Author(s):  
C. R. Tellier ◽  
C. R. Pichard ◽  
A. J. Tosser
Keyword(s):  
Grain Boundaries ◽  
Three Dimensional ◽  
Approximate Model ◽  
Metal Films ◽  
Three Dimensional Model ◽  
Polycrystalline Metal ◽  
Fine Grained ◽  
Thin Polycrystalline ◽  
Analytical Separation ◽  
Approximate Expressions

Analytical approximate expressions for the resistivity and its temperature coefficient of thin polycrystalline metal films have been derived by considering separately the contributions of the grain-boundaries perpendicular to thex-,y- andz-axes. Provided that the grain-boundaries act as moderately efficient scatterers reasonable deviations from the three-dimensional model are obtained; an approximate model then seems convenient with which to perform the calculations of the strain coefficients of such fine-grained films.

scholarly journals Phase Transformation in Ultra-Thin Films

2014 ◽  
Vol 996 ◽  
pp. 860-865
Author(s):  
Jay Chakraborty
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Phase Transformation ◽  
Film Thickness ◽  
Structural Phase ◽  
Metal Films ◽  
Structural Phase Transformation ◽  
Polycrystalline Metal ◽  
Film Microstructure ◽  
Thin Polycrystalline

Thickness dependent structural phase transformation in thin polycrystalline metal films has been reviewed. Various effects of film thickness reduction on film microstructure have been identified. Film thickness dependent structural phase transformation has been treated thermodynamically taking polycrystalline titanium (Ti) thin film as model example.

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