Transmission electron microscopy image analysis of composite precipitates in Al-Li-Zr alloys

Multifractal spectrums of sinter with different alkalinity were analyzed by multifractal software. The results show that sinter pore structure change from uniform to non-uniform with the improvement of alkalinity, Δα increases from 0.53 to 0.55. The structure of sinter pore is mainly microscopic by competition between macropores and micropores, Δf changes from 0.14 to-0.44. The distribution of sinter pores is quantitatively characterized by multi-fractal spectrum, which is consistent with transmission electron microscopy image.

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Nanoscale structure and texture of highly anisotropic pyrocarbons revisited with transmission electron microscopy, image processing, neutron diffraction and atomistic modeling

Carbon ◽

10.1016/j.carbon.2014.08.087 ◽

2014 ◽

Vol 80 ◽

pp. 472-489 ◽

Cited By ~ 35

Author(s):

B. Farbos ◽

P. Weisbecker ◽

H.E. Fischer ◽

J.-P. Da Costa ◽

M. Lalanne ◽

...

Keyword(s):

Electron Microscopy ◽

Image Processing ◽

Transmission Electron Microscopy ◽

Neutron Diffraction ◽

Transmission Electron Microscopy Image ◽

Atomistic Modeling ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Nanoscale Structure

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De-noising Filters for TEM (Transmission Electron Microscopy) Image of Nanomaterials

2012 Second International Conference on Advanced Computing & Communication Technologies ◽

10.1109/acct.2012.41 ◽

2012 ◽

Cited By ~ 8

Author(s):

Himmat S. Kushwaha ◽

Sanju Tanwar ◽

K.S. Rathore ◽

Sumit Srivastava

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Image ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Tem Transmission Electron Microscopy

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Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation

Journal of Electronic Materials ◽

10.1007/s11664-018-6140-x ◽

2018 ◽

Vol 47 (9) ◽

pp. 4955-4958

Author(s):

Iván Santos ◽

Manuel Ruiz ◽

María Aboy ◽

Luis A. Marqués ◽

Pedro López ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Image ◽

Image Simulation ◽

Extended Defect ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image

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Recent Developments in TEM Applications for the IC Industry

ISTFA 2008: Conference Proceedings from the 34th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2008p0014 ◽

2008 ◽

Author(s):

L. F. Fu ◽

Y. C. Wang ◽

B. Jiang ◽

F. Shen ◽

M. Strauss ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Gate Oxide ◽

Transmission Electron Microscopy Image ◽

New Developments ◽

Electron Microscopy Image ◽

Transmission Electron ◽

Microscopy Image ◽

Recent Developments ◽

Aberration Corrected

Abstract Recent developments in aberration-corrected transmission electron microscopy have drawn much attention from the semiconductor characterization community. Two new developments in transmission electron microscopy, image aberration correctors and probe aberration correctors, are discussed in term of their applications in characterizing gate oxide dielectrics for the IC industry.

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