Surface characterization of poly(acrylonitrile) based intermediate modulus carbon fibres

1996 ◽  
Vol 31 (23) ◽  
pp. 6305-6315 ◽  
Author(s):  
M. Desaeger ◽  
M. J. Reis ◽  
A. M. Botelho do Rego ◽  
J. D. Lopes da Silva ◽  
I. Verpoest
Keyword(s):  
Surface Characterization ◽  
Carbon Fibres ◽  
Poly Acrylonitrile

The Surface Characterization of Polyacrylonitrile-based Carbon Fibres by Electrochemical Techniques

1989 ◽  
Vol 1 (1) ◽  
pp. 85-94 ◽  
Author(s):  
S. J. Porter ◽  
C. L. DeArmitt ◽  
R. Robinson ◽  
J. P. Kirby ◽  
D. C. Bott
Keyword(s):  
Surface Characterization ◽  
Electrochemical Techniques ◽  
Carbon Fibres

Surface Characterization of Poly(acrylonitrile) Membranes Graft-Polymerized with Ionic Monomers As Revealed by ζ Potential Measurement

1998 ◽  
Vol 31 (4) ◽  
pp. 1277-1284 ◽  
Author(s):  
Toshihiko Jimbo ◽  
Mitsuru Higa ◽  
Norihiko Minoura ◽  
Akihiko Tanioka
Keyword(s):  
Surface Characterization ◽  
Potential Measurement ◽  
Ζ Potential ◽  
Poly Acrylonitrile

Remarks on the surface characterization of carbon fibres

1992 ◽  
Vol 18 (8) ◽  
pp. 623-630 ◽  
Author(s):  
E. Desimoni ◽  
G. I. Casella ◽  
T. R. I. Cataldi ◽  
A. M. Salvi ◽  
T. Rotunno ◽  
...  
Keyword(s):  
Surface Characterization ◽  
Carbon Fibres

Surface characterization of carbon fibres

Composites ◽  
1991 ◽  
Vol 22 (1) ◽  
pp. 59-62 ◽  
Author(s):  
J.B. Donnet ◽  
G. Guilpain
Keyword(s):  
Surface Characterization ◽  
Carbon Fibres

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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