Remarks on the surface characterization of carbon fibres

1992 ◽  
Vol 18 (8) ◽  
pp. 623-630 ◽  
Author(s):  
E. Desimoni ◽  
G. I. Casella ◽  
T. R. I. Cataldi ◽  
A. M. Salvi ◽  
T. Rotunno ◽  
...  
1989 ◽  
Vol 1 (1) ◽  
pp. 85-94 ◽  
Author(s):  
S. J. Porter ◽  
C. L. DeArmitt ◽  
R. Robinson ◽  
J. P. Kirby ◽  
D. C. Bott

1996 ◽  
Vol 31 (23) ◽  
pp. 6305-6315 ◽  
Author(s):  
M. Desaeger ◽  
M. J. Reis ◽  
A. M. Botelho do Rego ◽  
J. D. Lopes da Silva ◽  
I. Verpoest

Composites ◽  
1991 ◽  
Vol 22 (1) ◽  
pp. 59-62 ◽  
Author(s):  
J.B. Donnet ◽  
G. Guilpain

Author(s):  
R. E. Herfert

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.


Langmuir ◽  
2008 ◽  
Vol 24 (17) ◽  
pp. 9500-9507 ◽  
Author(s):  
Claudia Kolbeck ◽  
Manuela Killian ◽  
Florian Maier ◽  
Natalia Paape ◽  
Peter Wasserscheid ◽  
...  

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