Surface and in-depth characterization of TiC/C and Ti(C,N) layers by means of AES and Factor analysis
1995 ◽
Vol 353
(3-4)
◽
pp. 468-472
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Keyword(s):
Keyword(s):
2018 ◽
Vol 14
(10)
◽
pp. e1006520
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2016 ◽
Vol 23
(15)
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pp. 15381-15394
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2018 ◽
Vol 19
(5)
◽
pp. 1632-1641
Keyword(s):
2010 ◽
Vol 22
(11)
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pp. 1728-1734
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2014 ◽
Vol 6
(3-4)
◽
pp. 305-312
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Keyword(s):
1997 ◽
Vol 358
(1-2)
◽
pp. 304-307
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