Melting and premelting of silicates: Raman spectroscopy and X-ray diffraction of Li2SiO3 and Na2SiO3

1996 ◽  
Vol 23 (3) ◽  
Author(s):  
Pascal Richet ◽  
BjornO. Mysen ◽  
Denis Andrault
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray

Raman spectroscopy and X-ray diffraction of lithium niobate at temperatures up to 1300○-4.80pt○C

2005 ◽  
Vol 126 ◽  
pp. 101-105 ◽  
Author(s):  
B. Moulin ◽  
L. Hennet ◽  
D. Thiaudière ◽  
P. Melin ◽  
P. Simon
Keyword(s):  
Raman Spectroscopy ◽  
Lithium Niobate ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Structural and Raman Vibrational Studies ofCeO2-Bi2O3Oxide System

2009 ◽  
Vol 2009 ◽  
pp. 1-4 ◽  
Author(s):  
L. Bourja ◽  
B. Bakiz ◽  
A. Benlhachemi ◽  
M. Ezahri ◽  
J. C. Valmalette ◽  
...  
Keyword(s):  
Solid Solution ◽  
Raman Spectroscopy ◽  
Phase Changes ◽  
Phase System ◽  
X Ray Diffraction ◽  
X Ray ◽  
Vibrational Studies ◽  
Coprecipitation Route

A series of ceramics samples belonging to theCeO2-Bi2O3phase system have been prepared via a coprecipitation route. The crystallized phases were obtained by heating the solid precursors at600∘Cfor 6 hours, then quenching the samples. X-ray diffraction analyses show that forx<0.20a solid solutionCe1−xBixO2−x/2with fluorine structure is formed. For x ranging between 0.25 and 0.7, a tetragonalβ′phase coexisting with the FCC solid solution is observed. For x ranging between 0.8 and 0.9, a new tetragonalβphase appears. Theβ′phase is postulated to be a superstructure of theβphase. Finally, close tox=1, the classical monoclinicα Bi2O3structure is observed. Raman spectroscopy confirms the existence of the phase changes as x varies between 0 and 1.

scholarly journals Amorphization of a proposed sorbent of strontium, brushite, CaHPO4•2H2O, studied by X-ray diffraction and Raman spectroscopy

2021 ◽  
Vol 545 ◽  
pp. 152751
Author(s):  
Marie-Noëlle de Noirfontaine ◽  
Enrique Garcia-Caurel ◽  
Daniel Funes-Hernando ◽  
Mireille Courtial ◽  
Sandrine Tusseau-Nenez ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray

High pressure structural study of β-Ti3O5: X-ray diffraction and Raman spectroscopy

2012 ◽  
Vol 192 ◽  
pp. 356-359 ◽  
Author(s):  
Ye Wu ◽  
Qian Zhang ◽  
Xiang Wu ◽  
Shan Qin ◽  
Jing Liu
Keyword(s):  
Raman Spectroscopy ◽  
High Pressure ◽  
Structural Study ◽  
X Ray Diffraction ◽  
X Ray

Combinatorial (Ba,Sr)TiO3 thin film growth: X-ray diffraction and Raman spectroscopy

2009 ◽  
Vol 106 (3) ◽  
pp. 034108 ◽  
Author(s):  
H. Bouyanfif ◽  
J. Wolfman ◽  
M. El Marssi ◽  
Y. Yuzyuk ◽  
R. Bodeux ◽  
...  
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Film Growth ◽  
Thin Film Growth ◽  
Tio3 Thin Film ◽  
X Ray Diffraction ◽  
X Ray

Combined in situ X-ray diffraction and Raman spectroscopy on majoritic garnet inclusions in diamonds

2002 ◽  
Vol 198 (3-4) ◽  
pp. 485-493 ◽  
Author(s):  
Martin Kunz ◽  
Philippe Gillet ◽  
Guillaume Fiquet ◽  
Violaine Sautter ◽  
Heinz Graafsma ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
Majoritic Garnet ◽  
X Ray

Deposition of TRISO Particles With Superhard SiC Coatings and the Characterization of Anisotropy by Raman Spectroscopy

2009 ◽  
Vol 131 (4) ◽  
Author(s):  
E. López-Honorato ◽  
P. J. Meadows ◽  
J. Tan ◽  
Y. Xiang ◽  
P. Xiao
Keyword(s):  
Solid Solution ◽  
Raman Spectroscopy ◽  
Pyrolytic Carbon ◽  
X Ray Diffraction ◽  
X Ray ◽  
Flat Substrate ◽  
High Concentrations ◽  
Triso Particles ◽  
Sic Coatings

In this work we have deposited silicon carbide (SiC) at 1300°C with the addition of small amounts of propylene. The use of propylene and high concentrations of methyltrichlorosilane (9 vol %) allowed the deposition of superhard SiC coatings (42 GPa). The superhard SiC could result from the presence of a SiC–C solid solution, undetectable by X-ray diffraction but visible by Raman spectroscopy. Another sample obtained by the use of 50 vol % Argon, also showed the formation of SiC with good properties. The use of a flat substrate together with the particles showed the importance of carrying out the analysis on actual particles rather than in flat substrates. We show that it is possible to characterize the anisotropy of pyrolytic carbon by Raman spectroscopy.

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