Atomic force microscopy, scanning electric potential microscopy and contact-angle surface analysis of low-density polyethylene grafted with maleic anhydride

2004 ◽  
pp. 86-91
Author(s):  
M. F. Porto ◽  
E. M. Girotto ◽  
M. H. Kunita ◽  
M do Carmo Gonçalves ◽  
E. C. Muniz ◽  
...  
Keyword(s):  
Contact Angle ◽  
Atomic Force Microscopy ◽  
Maleic Anhydride ◽  
Surface Analysis ◽  
Electric Potential ◽  
Low Density Polyethylene ◽  
Low Density ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals AFM, Sepm And Contact Angle Surface Analysis On Low Density Polyethylene Grafted With Maleic Anhydride

2003 ◽  
Vol 9 (S02) ◽  
pp. 440-441
Author(s):  
M. F. Porto ◽  
M. H. Kunita ◽  
E. Radovanovic ◽  
M.C. Gonçalves ◽  
E.C. Muniz ◽  
...  
Keyword(s):  
Contact Angle ◽  
Maleic Anhydride ◽  
Surface Analysis ◽  
Low Density Polyethylene ◽  
Low Density

scholarly journals Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

2014 ◽  
Vol 39 (16) ◽  
pp. 4800 ◽  
Author(s):  
C. H. van Hoorn ◽  
D. C. Chavan ◽  
B. Tiribilli ◽  
G. Margheri ◽  
A. J. G. Mank ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Probe

Silicone hydrogel contact lens surface analysis by atomic force microscopy: shape parameters

2011 ◽  
Author(s):  
M. J. Giraldez ◽  
C. Garcia-Resua ◽  
M. Lira ◽  
C. Sánchez-Sellero ◽  
E. Yebra-Pimentel
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Contact Lens ◽  
Shape Parameters ◽  
Force Microscopy ◽  
Silicone Hydrogel ◽  
Atomic Force ◽  
Lens Surface

Surface analysis of the photosystem I complex by electron and atomic force microscopy

1998 ◽  
Vol 283 (1) ◽  
pp. 83-94 ◽  
Author(s):  
Dimitrios Fotiadis ◽  
Daniel J Müller ◽  
Georgios Tsiotis ◽  
Lorenz Hasler ◽  
Peter Tittmann ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Photosystem I ◽  
Force Microscopy ◽  
Atomic Force ◽  
Photosystem I Complex

Acrylamide Polymerized in the Presence of Surfactants:  Surface Analysis Using Atomic Force Microscopy

Langmuir ◽  
2002 ◽  
Vol 18 (16) ◽  
pp. 6449-6452 ◽  
Author(s):  
Mukundan Chakrapani ◽  
David H. Van Winkle ◽  
Brian C. Patterson ◽  
Randolph L. Rill
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Force Microscopy ◽  
Atomic Force
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