Acrylamide Polymerized in the Presence of Surfactants:  Surface Analysis Using Atomic Force Microscopy

Langmuir ◽  
2002 ◽  
Vol 18 (16) ◽  
pp. 6449-6452 ◽  
Author(s):  
Mukundan Chakrapani ◽  
David H. Van Winkle ◽  
Brian C. Patterson ◽  
Randolph L. Rill
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

2014 ◽  
Vol 39 (16) ◽  
pp. 4800 ◽  
Author(s):  
C. H. van Hoorn ◽  
D. C. Chavan ◽  
B. Tiribilli ◽  
G. Margheri ◽  
A. J. G. Mank ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Near Field ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Probe

Silicone hydrogel contact lens surface analysis by atomic force microscopy: shape parameters

2011 ◽  
Author(s):  
M. J. Giraldez ◽  
C. Garcia-Resua ◽  
M. Lira ◽  
C. Sánchez-Sellero ◽  
E. Yebra-Pimentel
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Contact Lens ◽  
Shape Parameters ◽  
Force Microscopy ◽  
Silicone Hydrogel ◽  
Atomic Force ◽  
Lens Surface

Surface analysis of the photosystem I complex by electron and atomic force microscopy

1998 ◽  
Vol 283 (1) ◽  
pp. 83-94 ◽  
Author(s):  
Dimitrios Fotiadis ◽  
Daniel J Müller ◽  
Georgios Tsiotis ◽  
Lorenz Hasler ◽  
Peter Tittmann ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Photosystem I ◽  
Force Microscopy ◽  
Atomic Force ◽  
Photosystem I Complex

Atomic force microscopy surface analysis of layered perovskite La2Ti2O7particles grown by molten flux method

2016 ◽  
Vol 55 (8S1) ◽  
pp. 08NB08 ◽  
Author(s):  
Aslihan Orum ◽  
Kazumasa Takatori ◽  
Shigeo Hori ◽  
Tomiko Ikeda ◽  
Masamichi Yoshimura ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Layered Perovskite ◽  
Flux Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molten Flux

Surface analysis of nanomachined films using atomic force microscopy

2005 ◽  
Vol 92 (2-3) ◽  
pp. 379-383 ◽  
Author(s):  
Te-Hua Fang ◽  
Win-Jin Chang ◽  
Cheng-I Weng
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Force Microscopy ◽  
Atomic Force

Surface analysis with atomic force microscopy through measurement in air and under liquids

1994 ◽  
Vol 113 (3-6) ◽  
pp. 179-202 ◽  
Author(s):  
Gernot Friedbacher ◽  
Thomas Prohaska ◽  
Manfred Grasserbauer
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Analysis ◽  
Force Microscopy ◽  
Atomic Force

Nanoscale-resolved elasticity: contact mechanics for quantitative contact resonance atomic force microscopy

Nanoscale ◽  
2014 ◽  
Vol 6 (12) ◽  
pp. 6898-6910 ◽  
Author(s):  
A. M. Jakob ◽  
J. Buchwald ◽  
B. Rauschenbach ◽  
S. G. Mayr
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Mechanics ◽  
Surface Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance

Abilities of quantitative nanomechanical surface analysis are improved by a deeper understanding of influences on nanoscale contact physics.

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