Screen-Sharing Technology for Cooperative CAPP System in a Networked Manufacturing Environment

2006 ◽  
pp. 375-383
Author(s):  
Zhaomin Xu ◽  
Ming Cai ◽  
Lanfen Lin ◽  
Jinxiang Dong
Keyword(s):  
Networked Manufacturing ◽  
Manufacturing Environment ◽  
Screen Sharing

Study on Supplier Selecting System Oriented Networked Manufacturing

2010 ◽  
Vol 44-47 ◽  
pp. 960-964
Author(s):  
Zi Xu Lui ◽  
Tian Biao Yu ◽  
Jing Qiang Zhang ◽  
Wan Shan Wang
Keyword(s):  
Theoretical Study ◽  
Selection Function ◽  
Prototype System ◽  
Supplier Evaluation ◽  
Main Function ◽  
Networked Manufacturing ◽  
Selection System ◽  
Manufacturing Environment ◽  
Function Modules ◽  
Selection Of

This paper analyzes the characteristics of supplier selection base on network manufacturing environment. The requirements of supplier evaluation and selection function of the system were analyzed too. Supplier evaluation and selection of system architecture and workflow was studied oriented networked manufacturing environment. Base on the theoretical study a prototype system was developed and the main function modules were introduced. This paper provides a theoretical and technical reference to develop efficient and practical supplier evaluation and selection system to meet the requirements of networked manufacturing.

Integration of process planning and scheduling using mobile-agent based approach in a networked manufacturing environment

2016 ◽  
Vol 94 ◽  
pp. 63-73 ◽  
Author(s):  
Vijaya Kumar Manupati ◽  
Goran D. Putnik ◽  
Manoj Kumar Tiwari ◽  
Paulo Ávila ◽  
Maria Manuela Cruz-Cunha
Keyword(s):  
Process Planning ◽  
Mobile Agent ◽  
Networked Manufacturing ◽  
Manufacturing Environment ◽  
Planning And Scheduling ◽  
Agent Based

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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