Combination of ion beam techniques, AES and SIMS for the analysis of samples exposed in the plasma boundary of the JET tokamak
1989 ◽
Vol 14
(9)
◽
pp. 543-551
◽
1990 ◽
Vol 61
(8)
◽
pp. 2171-2175
◽
1980 ◽
Vol 7
(1)
◽
pp. 13-16
◽