scholarly journals Acquisition of artifact free alkali metal distributions in SiO 2 by ToF‐SIMS Cs + depth profiling at low temperatures

2021 ◽  
Author(s):  
Michael Leitzenberger ◽  
Peter Kuegler ◽  
Stefan Krivec ◽  
Herbert Hutter
Keyword(s):  
Alkali Metal ◽  
Low Temperatures ◽  
Depth Profiling ◽  
Free Alkali ◽  
Tof Sims

Crowning Metal Ions by Supramolecularization as a General Remedy toward a Dendrite‐Free Alkali‐Metal Battery

2021 ◽  
pp. 2101745
Author(s):  
Ziyang Lu ◽  
Yong Guo ◽  
Siwei Zhang ◽  
Shichao Wu ◽  
Rongwei Meng ◽  
...  
Keyword(s):  
Alkali Metal ◽  
Metal Ions ◽  
Free Alkali

scholarly journals Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling

2021 ◽  
Vol 27 (S1) ◽  
pp. 1564-1565
Author(s):  
Vincent Smentkowski ◽  
Shubhodeep Goswami ◽  
Felix Kollmer ◽  
Julia Zakel ◽  
Henrik Arlinghaus ◽  
...  
Keyword(s):  
Thin Film ◽  
Depth Profiling ◽  
Tof Sims

Determination of the pH and the free alkali metal content in the pore solution of concrete: Review and experimental comparison

2017 ◽  
Vol 96 ◽  
pp. 13-26 ◽  
Author(s):  
G. Plusquellec ◽  
M.R. Geiker ◽  
J. Lindgård ◽  
J. Duchesne ◽  
B. Fournier ◽  
...  
Keyword(s):  
Alkali Metal ◽  
Metal Content ◽  
Pore Solution ◽  
Free Alkali ◽  
Experimental Comparison

Surface Properties and Gas Adsorption

2003 ◽  
Author(s):  
Toshiaki Enoki ◽  
Morinobu Endo ◽  
Masatsugu Suzuki
Keyword(s):  
Alkali Metal ◽  
Activated Charcoal ◽  
Low Temperatures ◽  
Gas Adsorption ◽  
Hydrogen Adsorption ◽  
Hydrogen Chemisorption ◽  
Guest Molecules ◽  
Hydrogen Molecules ◽  
General Aspects ◽  
Stage 1

It is well known that alkali metal binary GICs adsorb gaseous species (H2, N2, Ar, CH4, etc.) physisorptively at low temperatures, where physisorbed gaseous molecules are accommodated in the interstitials of the alkali metal lattice within the graphitic galleries (Lagrange and Hérold, 1975; Lagrange et al., 1972, 1976; Watanabe et al., 1971, 1972, 1973). The capacity for hydrogen adsorption, which is estimated at 144 cm3/g in KC24, for example, is large and comparable to the capacity in other adsorbers such as zeolite or activated charcoal. Interestingly, the physisorption phenomenon in alkali metal GICs has different features from that in conventional adsorbents such as zeolite or activated charcoal; that is, guest molecules in alkali metal GICs are not simply bonded to the adsorbents through weak van der Waals forces without any change in the electronic structures. Here we discuss the gas physisorption phenomenon in alkali metal GICs from general aspects, in relation to their specific features. Then in subsequent sections, we will give details of actual cases. Hydrogen is a typical gaseous molecule adsorbed in alkali metal GICs. Hydrogen physisorption takes place at low temperatures below about 200 K, where hydrogen molecules are accommodated in the graphitic galleries and are not dissociated into atomic hydrogen species. When the temperature is increased to over 200 K, the alkali metal GICs work as catalysts to hydrogen, resulting in the occurrence of hydrogen chemisorption. Hydrogen physisorption will be discussed in Section 8.1.2, hydrogen chemisorption and related issues have been discussed partly in Sections 2.2.1 and 5.4.1 from the viewpoints of structure and electronic properties, and will be discussed again in Section 8.1.2. Figure 8.1 represents the composition dependence of the amount of physisorption of hydrogen molecules in KCm at 77 K (Lagrange and Hérold, 1975). The composition of 1/m = 1/8 corresponds to the stage-1 compound and the composition 1/m = 1/24 to the stage-2 compound; intermediate compositions between 1/8 and 1/24 are considered to have a mixed structure of stage-1 and stage-2 compounds. The stage-1 compound does not adsorb hydrogen at all.

Oxygen diffusion in amorphous and partially crystalline gallium oxide

2019 ◽  
Vol 21 (8) ◽  
pp. 4268-4275 ◽  
Author(s):  
Alexandra von der Heiden ◽  
Manuel Bornhöfft ◽  
Joachim Mayer ◽  
Manfred Martin
Keyword(s):  
Activation Energy ◽  
Diffusion Coefficients ◽  
Low Temperatures ◽  
Oxygen Diffusion ◽  
Gallium Oxide ◽  
Tracer Diffusion ◽  
Tof Sims ◽  
Tracer Diffusion Coefficients ◽  
Oxygen Tracer

We established a TTT diagram of crystallisation of gallium oxide. Determination of oxygen tracer diffusion coefficients by IEDP/ToF-SIMS allowed us to access the activation energy for amorphous GaO1.5 at low temperatures.

Depth Profiling of Organic Light-Emitting Diodes by ToF-SIMS Coupled with Wavelet–Principal Component Analysis

2019 ◽  
Vol 1 (7) ◽  
pp. 1821-1828 ◽  
Author(s):  
Céline Noël ◽  
Nunzio Tuccitto ◽  
Yan Busby ◽  
Manuel Auer-Berger ◽  
Antonino Licciardello ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Light Emitting Diodes ◽  
Depth Profiling ◽  
Principal Component ◽  
Component Analysis ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Tof Sims ◽  
Organic Light

A Scalable Approach for Dendrite-Free Alkali Metal Anodes via Room-Temperature Facile Surface Fluorination

2019 ◽  
Vol 11 (5) ◽  
pp. 4962-4968 ◽  
Author(s):  
Gang Wang ◽  
Xunhui Xiong ◽  
Dong Xie ◽  
Xiangxiang Fu ◽  
Zhihua Lin ◽  
...  
Keyword(s):  
Alkali Metal ◽  
Room Temperature ◽  
Free Alkali ◽  
Surface Fluorination ◽  
Metal Anodes

TOF-SIMS depth profiling of SIMON

2003 ◽  
Vol 203-204 ◽  
pp. 441-444
Author(s):  
Ge Xin ◽  
Gui Dong ◽  
Chen Xu ◽  
Cha Liangzhen ◽  
O. Brox ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Tof Sims ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 190-193 ◽  
Author(s):  
Nimer Wehbe ◽  
Laurent Houssiau
Keyword(s):  
Vitamin C ◽  
Depth Profiling ◽  
Ion Beams ◽  
Tof Sims ◽  
Sims Depth Profiling

TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

2008 ◽  
Vol 393 (8) ◽  
pp. 1857-1861 ◽  
Author(s):  
J. Schnöller ◽  
R. Franz ◽  
C. Mitterer ◽  
H. Hutter
Keyword(s):  
Depth Profiling ◽  
Hard Coatings ◽  
Tof Sims ◽  
Sims Depth Profiling ◽  
Element Mapping
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