scholarly journals Investigations into the interactions of a MALDI Matrix with organic thin films using C60 + SIMS depth profiling

2014 ◽  
Vol 46 (S1) ◽  
pp. 67-69 ◽  
Author(s):  
Jordan O. Lerach ◽  
Selda Keskin ◽  
Nicholas Winograd
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Organic Thin Films ◽  
Maldi Matrix ◽  
Sims Depth Profiling

X-ray Photoelectron Spectrometry Depth Profiling of Organic Thin Films Using C60Sputtering

2008 ◽  
Vol 80 (2) ◽  
pp. 501-505 ◽  
Author(s):  
Ying-Yu Chen ◽  
Bang-Ying Yu ◽  
Wei-Ben Wang ◽  
Mao-Feng Hsu ◽  
Wei-Chun Lin ◽  
...  
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Organic Thin Films ◽  
X Ray

Investigating the chain conformations of spin-coated polymer thin films by ToF-SIMS depth profiling

2015 ◽  
Vol 47 (10) ◽  
pp. 953-960 ◽  
Author(s):  
Xianwen Ren ◽  
Lu-Tao Weng ◽  
Yi Fu ◽  
Kai-Mo Ng ◽  
Chi-Ming Chan
Keyword(s):  
Thin Films ◽  
Polymer Thin Films ◽  
Depth Profiling ◽  
Tof Sims ◽  
Chain Conformations ◽  
Sims Depth Profiling

Distribution of intercalated lithium in V2O5 thin films determined by SIMS depth profiling

2006 ◽  
Vol 38 (4) ◽  
pp. 847-850 ◽  
Author(s):  
D. Alamarguy ◽  
J. E. Castle ◽  
M. Liberatore ◽  
F. Decker
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
V2o5 Thin Films ◽  
Sims Depth Profiling

Infrared spectroscopy depth profiling of organic thin films

2021 ◽  
Author(s):  
Jinde Yu ◽  
Yifan Xing ◽  
Zichao Shen ◽  
Yuanwei Zhu ◽  
Dieter Neher ◽  
...  
Keyword(s):  
Thin Films ◽  
Infrared Spectroscopy ◽  
Ir Spectra ◽  
Plasma Etching ◽  
Depth Profiling ◽  
Organic Thin Films ◽  
Organic Films ◽  
Organic Film ◽  
Film Property

FDD-IR spectra combined with soft plasma etching is introduced to study organic film property along film-depth. It provides insights into different kinds of organic films, all equipment and methodology are easily accessible in laboratories worldwide.

Investigation of Hg sorption and diffusion behavior on ultra-thin films of gold using QCM response analysis and SIMS depth profiling

2012 ◽  
Vol 22 (39) ◽  
pp. 20929 ◽  
Author(s):  
Ylias M. Sabri ◽  
Samuel J. Ippolito ◽  
Mohammad Al Kobaisi ◽  
Matthew J. Griffin ◽  
David R. Nelson ◽  
...  
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Response Analysis ◽  
Diffusion Behavior ◽  
And Diffusion ◽  
Sims Depth Profiling
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