SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials

2010 ◽  
Vol 42 (10-11) ◽  
pp. 1612-1615 ◽  
Author(s):  
Jiro Matsuo ◽  
Satoshi Ninomiya ◽  
Hideaki Yamada ◽  
Kazuya Ichiki ◽  
Yoshinobu Wakamatsu ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Biological Materials ◽  
Molecular Depth Profiling

Molecular depth profiling of organic and biological materials

2006 ◽  
Vol 252 (19) ◽  
pp. 6513-6516 ◽  
Author(s):  
John S. Fletcher ◽  
Xavier A. Conlan ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Depth Profiling ◽  
Biological Materials ◽  
Molecular Depth Profiling

scholarly journals Direct comparison of Au3+ and C60+ cluster projectiles in SIMS molecular depth profiling

2007 ◽  
Vol 18 (3) ◽  
pp. 406-412 ◽  
Author(s):  
Juan Cheng ◽  
Joseph Kozole ◽  
Robert Hengstebeck ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Molecular Depth Profiling

Molecular depth profiling of trehalose using a C60 cluster ion beam

2008 ◽  
Vol 255 (4) ◽  
pp. 959-961 ◽  
Author(s):  
Andreas Wucher ◽  
Juan Cheng ◽  
Nicholas Winograd
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Molecular Depth Profiling ◽  
Cluster Ion

Investigations of molecular depth profiling with dual beam sputtering

2012 ◽  
Vol 45 (1) ◽  
pp. 175-177 ◽  
Author(s):  
C. Lu ◽  
A. Wucher ◽  
N. Winograd
Keyword(s):  
Depth Profiling ◽  
Dual Beam ◽  
Molecular Depth Profiling ◽  
Beam Sputtering

scholarly journals Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals

2010 ◽  
Vol 43 (1-2) ◽  
pp. 45-48 ◽  
Author(s):  
D. Willingham ◽  
D. A. Brenes ◽  
N. Winograd ◽  
A. Wucher
Keyword(s):  
Strong Field ◽  
Depth Profiling ◽  
Molecular Depth Profiling

Ultra-low-angle microtomy to back up S-SIMS molecular depth profiling with C60 + and Bin + for the nanoscale analysis of high-tech industrial materials

2010 ◽  
Vol 43 (1-2) ◽  
pp. 389-392
Author(s):  
R. De Mondt ◽  
Y. Vercammen ◽  
R. Dardenne ◽  
F. Vangaever ◽  
J. Van Luppen ◽  
...  
Keyword(s):  
Depth Profiling ◽  
High Tech ◽  
Molecular Depth Profiling ◽  
Industrial Materials
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