scholarly journals What can Raman spectroscopy and spectroscopic ellipsometry bring for the characterisation of thin films and materials surface?

2008 ◽  
Vol 40 (3-4) ◽  
pp. 588-592 ◽  
Author(s):  
Renata Lewandowska ◽  
Mélanie Gaillet ◽  
Gwénaëlle Le Bourdon ◽  
Céline Eypert ◽  
Sophie Morel ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Spectroscopic Ellipsometry

Insights into the effects of metal nanostructuring and oxidation on the work function and charge transfer of metal/graphene hybrids

Nanoscale ◽  
2015 ◽  
Vol 7 (30) ◽  
pp. 12868-12877 ◽  
Author(s):  
M. M. Giangregorio ◽  
W. Jiao ◽  
G. V. Bianco ◽  
P. Capezzuto ◽  
A. S. Brown ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Charge Transfer ◽  
Work Function ◽  
Spectroscopic Ellipsometry ◽  
Cvd Graphene ◽  
Non Invasive

Charge transfer between CVD graphene and thin films and nanoparticles of various sizes of Al, Ga, Au, Cu and Ag was probed by various corroborating non-invasive approaches of KPFM, Raman spectroscopy and plasmonic spectroscopic ellipsometry.

scholarly journals Evaluation of Crystalline Volume Fraction of Laser-Annealed Polysilicon Thin Films Using Raman Spectroscopy and Spectroscopic Ellipsometry

Micromachines ◽  
2021 ◽  
Vol 12 (8) ◽  
pp. 999
Author(s):  
Jeongsang Pyo ◽  
Bohae Lee ◽  
Han-Youl Ryu
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Spectroscopic Ellipsometry ◽  
Laser Annealing ◽  
Continuous Wave ◽  
Volume Fraction ◽  
Three Dimensional ◽  
Green Laser ◽  
Blue Laser ◽  
Good Crystallinity

We investigated the crystallinities of poly silicon (poly Si) annealed via green laser annealing (GLA) with a 532-nm pulsed laser and blue laser annealing (BLA) with 450-nm continuous-wave lasers. Three-dimensional heat transfer simulations were performed to obtain the temperature distributions in an amorphous silicon (a-Si) thin film, and GLA and BLA experiments were conducted based on the thermal simulation results. The crystallinity of annealed poly Si samples was analyzed using Raman spectroscopy and spectroscopic ellipsometry. To evaluate the degree of crystallization for the annealed samples quantitatively, the measured spectra of laser-annealed poly Si were fitted to those of crystalline Si and a-Si, and the crystal volume fraction (fc) of the annealed poly Si sample was determined. Both the Raman spectroscopy and ellipsometry showed consistent results on fc. The fc values were found to reach >85% for optimum laser power of GLA and BLA, showing good crystallinity of the laser-annealed poly Si thin films comparable to thermal furnace annealing.

Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

2003 ◽  
Vol 119 (12) ◽  
pp. 6335-6340 ◽  
Author(s):  
M. I. Alonso ◽  
M. Garriga ◽  
J. O. Ossó ◽  
F. Schreiber ◽  
E. Barrena ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

scholarly journals Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films

2021 ◽  
Vol 129 (24) ◽  
pp. 243102
Author(s):  
Kohei Oiwake ◽  
Yukinori Nishigaki ◽  
Shohei Fujimoto ◽  
Sara Maeda ◽  
Hiroyuki Fujiwara
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

scholarly journals Impact of changes in bond structure on ovonic threshold switching behaviour in GeSe2

2021 ◽  
Vol 9 (1) ◽  
pp. 117-126
Author(s):  
Jonas Keukelier ◽  
Karl Opsomer ◽  
Thomas Nuytten ◽  
Stefanie Sergeant ◽  
Wouter Devulder ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Electrical Behaviour ◽  
Electrical Measurements ◽  
Threshold Switching ◽  
Switching Behaviour

Raman spectroscopy and electrical measurements are performed on sputtered GexSe1−x thin films to identify and link bond presence to electrical behaviour.

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

Enhanced waveguide Raman spectroscopy with thin films. Plenary lecture

The Analyst ◽  
1994 ◽  
Vol 119 (4) ◽  
pp. 491 ◽  
Author(s):  
S. Ellahi ◽  
R. E. Hester
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Plenary Lecture
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