Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy

2004 ◽  
Vol 36 (8) ◽  
pp. 1203-1206 ◽  
Author(s):  
D. Franta ◽  
I. Ohlídal ◽  
P. Klapetek ◽  
M. Ohlídal
Keyword(s):  
Atomic Force Microscopy ◽  
Oxide Films ◽  
Optical Methods ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gaas Substrates ◽  
Thin Oxide Films ◽  
Thin Oxide

Atomic Force Microscopy Study of Nickel Oxide Films Modified by Reactive Element

1994 ◽  
Vol 343 ◽  
Author(s):  
F. Czerwinski ◽  
J.A. Szpunar
Keyword(s):  
Atomic Force Microscopy ◽  
Substrate Surface ◽  
Oxide Films ◽  
Microscopy Study ◽  
Reactive Element ◽  
Pure Oxygen ◽  
Polycrystalline Nickel ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Oxide Films

ABSTRACTThe evolution of microstructure of thin oxide films during growth has been quantitatively analysed by atomic force microscopy (AFM). The oxide films were formed in pure oxygen atmosphere at temperatures ranging from 873 to 1173 K on polycrystalline nickel substrates. The substrates were both pure and superficially modified by nanometer-sized dispersions of CeO2. The incorporation of reactive element into the oxide inhibits the growth kinetics and affects the microscopic surface morphology. The extent of this effect depends essentially on the substrate surface microstructure prior to modification and the size of CeO2 particles. A correlation was found between the surface topography and the reduction of oxide growth rate caused by the reactive element.

Characterization of the boundaries of thin films of TiO2by atomic force microscopy and optical methods

2002 ◽  
Vol 34 (1) ◽  
pp. 759-762 ◽  
Author(s):  
D. Franta ◽  
I. Ohlídal ◽  
P. Klapetek ◽  
P. Pokorný
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Optical Methods ◽  
Force Microscopy ◽  
Atomic Force

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa
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