Characterization of the boundaries of thin films of TiO2by atomic force microscopy and optical methods

D. Franta; I. Ohlídal; P. Klapetek; P. Pokorný

doi:10.1002/sia.1405

Characterization of the boundaries of thin films of TiO2by atomic force microscopy and optical methods

Surface and Interface Analysis ◽

10.1002/sia.1405 ◽

2002 ◽

Vol 34 (1) ◽

pp. 759-762 ◽

Cited By ~ 13

Author(s):

D. Franta ◽

I. Ohlídal ◽

P. Klapetek ◽

P. Pokorný

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Optical Methods ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Micromorphological characterization of polymer-oxide nanocomposite thin films by atomic force microscopy and fractal geometry analysis

Progress in Organic Coatings ◽

10.1016/j.porgcoat.2015.07.024 ◽

2015 ◽

Vol 89 ◽

pp. 50-56 ◽

Cited By ~ 17

Author(s):

Ştefan Ţălu ◽

Niranjan Patra ◽

Marco Salerno

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Fractal Geometry ◽

Force Microscopy ◽

Atomic Force ◽

Nanocomposite Thin Films ◽

Geometry Analysis

Download Full-text

Electrical characterization of oxygen-induced nanosized ripples on aluminum thin films by conductive atomic force microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2005.07.245 ◽

2006 ◽

Vol 243 (1) ◽

pp. 16-19 ◽

Cited By ~ 12

Author(s):

P. Mishra ◽

P. Karmakar ◽

D. Ghose

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-012-6419-3 ◽

2012 ◽

Vol 405 (5) ◽

pp. 1463-1478 ◽

Cited By ~ 56

Author(s):

Daniele Passeri ◽

Marco Rossi ◽

Emanuela Tamburri ◽

Maria Letizia Terranova

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Mechanical Characterization ◽

Polymeric Thin Films ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

Journal of Metastable and Nanocrystalline Materials ◽

10.4028/www.scientific.net/jmnm.20-21.611 ◽

2004 ◽

Vol 20-21 ◽

pp. 611-616

Author(s):

José M. Barandiarán ◽

Iñaki Orue ◽

M.L. Fdez-Gubieda ◽

A. García Prieto

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Theoretical analysis of the atomic force microscopy characterization of columnar thin films

Ultramicroscopy ◽

10.1016/s0304-3991(02)00159-6 ◽

2003 ◽

Vol 94 (1) ◽

pp. 19-29 ◽

Cited By ~ 27

Author(s):

Petr Klapetek ◽

Ivan Ohlı́dal

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Theoretical Analysis ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

Download Full-text

Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

Materials Research Bulletin ◽

10.1016/j.materresbull.2015.05.002 ◽

2015 ◽

Vol 70 ◽

pp. 373-378 ◽

Cited By ~ 18

Author(s):

N. Muhunthan ◽

Om Pal Singh ◽

Vijaykumar Toutam ◽

V.N. Singh

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Grain Boundaries ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Czts Thin Films ◽

Microscopy Techniques

Download Full-text

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.39.3830 ◽

2000 ◽

Vol 39 (Part 1, No. 6B) ◽

pp. 3830-3833 ◽

Cited By ~ 41

Author(s):

Takeshi Fukuma ◽

Kei Kobayashi ◽

Toshihisa Horiuchi ◽

Hirofumi Yamada ◽

Kazumi Matsushige

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Variable Temperature ◽

Polymer Thin Films ◽

Nanometer Scale ◽

Force Microscopy ◽

Ferroelectric Polymer ◽

Atomic Force ◽

Scale Characterization

Download Full-text

Characterization of local electrical properties of polycrystalline silicon thin films and hydrogen termination effect by conductive atomic force microscopy

Applied Physics Letters ◽

10.1063/1.3130210 ◽

2009 ◽

Vol 94 (18) ◽

pp. 182104 ◽

Cited By ~ 6

Author(s):

Emi Machida ◽

Yukiharu Uraoka ◽

Takashi Fuyuki ◽

Ryohei Kokawa ◽

Takeshi Ito ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Properties ◽

Polycrystalline Silicon ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Silicon Thin Films ◽

Atomic Force ◽

Hydrogen Termination

Download Full-text

Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

physica status solidi (a) ◽

10.1002/pssa.201330113 ◽

2013 ◽

Vol 210 (11) ◽

pp. 2416-2422 ◽

Cited By ~ 1

Author(s):

Daniele Pelliccia ◽

Sasikaran Kandasamy ◽

Michael James

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

X Ray ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Acoustics and atomic force microscopy for the mechanical characterization of thin films

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-009-3402-8 ◽

2010 ◽

Vol 396 (8) ◽

pp. 2769-2783 ◽

Cited By ~ 23

Author(s):

Daniele Passeri ◽

Andrea Bettucci ◽

Marco Rossi

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Mechanical Characterization ◽

Force Microscopy ◽

Atomic Force

Download Full-text