Quantitative chemical composition of thin films with infrared spectroscopic ellipsometry: application to hydrated oxide films on aluminium

2003 ◽  
Vol 35 (4) ◽  
pp. 387-394 ◽  
Author(s):  
S. Van Gils ◽  
C. A. Melendres ◽  
H. Terryn
Keyword(s):  
Thin Films ◽  
Chemical Composition ◽  
Spectroscopic Ellipsometry ◽  
Oxide Films ◽  
Infrared Spectroscopic ◽  
Hydrated Oxide ◽  
Quantitative Chemical

Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry

1998 ◽  
Vol 313-314 ◽  
pp. 692-696 ◽  
Author(s):  
M. Schubert ◽  
E. Franke ◽  
H. Neumann ◽  
T.E. Tiwald ◽  
D.W. Thompson ◽  
...  
Keyword(s):  
Thin Films ◽  
Boron Nitride ◽  
Spectroscopic Ellipsometry ◽  
Mixed Phase ◽  
Infrared Spectroscopic

Infrared spectroscopic ellipsometry of (Pb, La)(Zr, Ti)O3 thin films on platinized silicon

2004 ◽  
Vol 320 (5-6) ◽  
pp. 478-486 ◽  
Author(s):  
Z.G. Hu ◽  
F.W. Shi ◽  
T. Lin ◽  
Z.M. Huang ◽  
G.S. Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Infrared Spectroscopic

Chemical composition effects in the thin films of the colossal magnetoresistive perovskite manganates grown by MOCVD

1999 ◽  
Vol 09 (PR8) ◽  
pp. Pr8-659-Pr8-666 ◽  
Author(s):  
O. Yu. Gorbenko ◽  
I. E. Graboy ◽  
A. A. Bosak ◽  
V. A. Amelichev ◽  
A. Yu. Ganin ◽  
...  
Keyword(s):  
Thin Films ◽  
Chemical Composition ◽  
Colossal Magnetoresistive ◽  
Composition Effects

Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

2003 ◽  
Vol 119 (12) ◽  
pp. 6335-6340 ◽  
Author(s):  
M. I. Alonso ◽  
M. Garriga ◽  
J. O. Ossó ◽  
F. Schreiber ◽  
E. Barrena ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry
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