Test cost reduction for logic circuits: Reduction of test data volume and test application time

2005 ◽  
Vol 36 (6) ◽  
pp. 69-83 ◽  
Author(s):  
Yoshinobu Higami ◽  
Seiji Kajihara ◽  
Hideyuki Ichihara ◽  
Yuzo Takamatsu
Keyword(s):  
Test Data ◽  
Cost Reduction ◽  
Logic Circuits ◽  
Application Time ◽  
Test Cost ◽  
Test Application Time ◽  
Test Cost Reduction ◽  
Test Application ◽  
Data Volume

scholarly journals Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

2009 ◽  
Vol E92-D (7) ◽  
pp. 1462-1465 ◽  
Author(s):  
Yongjoon KIM ◽  
Myung-Hoon YANG ◽  
Jaeseok PARK ◽  
Eunsei PARK ◽  
Sungho KANG
Keyword(s):  
Test Data ◽  
Application Time ◽  
Test Application Time ◽  
Test Application ◽  
Data Volume
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