scholarly journals Improved depth of field in the scanning electron microscope derived from through-focus image stacks

Scanning ◽  
2006 ◽  
Vol 26 (6) ◽  
pp. 265-269 ◽  
Author(s):  
Alan Boyde
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Depth Of Field ◽  
Focus Image ◽  
Scanning Electron

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Visualization of Internal Skin Structures with the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 46-47
Author(s):  
Emil Bernstein
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Great Depth ◽  
Hair Follicles ◽  
Depth Of Field ◽  
Pig Skin ◽  
Realistic Picture ◽  
Main Components ◽  
Scanning Electron

An interesting method for examining structures in g. pig skin has been developed. By modifying an existing technique for splitting skin into its two main components—epidermis and dermis—we can in effect create new surfaces which can be examined with the scanning electron microscope (SEM). Although this method is not offered as a complete substitute for sectioning, it provides the investigator with a means for examining certain structures such as hair follicles and glands intact. The great depth of field of the SEM complements the technique so that a very “realistic” picture of the organ is obtained.

Examination of Frozen, Hydrated Mites Using Low Temperature Field Emission Scanning Electron Microscopy

2000 ◽  
Vol 6 (S2) ◽  
pp. 874-875 ◽  
Author(s):  
Ronald Ochoa ◽  
Eric F. Erbe ◽  
Jeffery S. Pettis ◽  
William P. Wergin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Temperature Field ◽  
Electron Microscope ◽  
Low Temperature ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Viral Diseases ◽  
Depth Of Field ◽  
Scanning Electron

Mites, the second largest arthropod group after insects, occupy every conceivable terrestrial and aquatic habitat in our environment. They feed on plants, infest food products such as meat, cheese and grains, parasitize invertebrates and vertebrates, and transmit fungal, bacterial, rickettsial and viral diseases. Estimates indicate that as many as 1,000,000 species of mites may exist; however, partly because of their microscopic size, only about 40,000 species have been described and classified. During the last 30 years, researchers have increasingly utilized the greater magnification and depth of field available in a conventional scanning electron microscope (SEM) to supplement descriptions of mites that were historically based on light microscopic observations. In addition, this technique provided a better understanding of the relative positions and functionality of organs and improved attempts to elucidate their biology. However, before mites can be imaged with a conventional SEM, they are typically chemically fixed, dehydrated and/or thoroughly dried.

New techniques and applications for epi-illumination light microscopy

1995 ◽  
Vol 73 (11) ◽  
pp. 1842-1847 ◽  
Author(s):  
Christian R. Lacroix ◽  
Judith MacIntyre
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Depth Of Field ◽  
New Techniques ◽  
Illumination System ◽  
Simple Preparation ◽  
Stereo Microscope ◽  
Material Saving ◽  
Scanning Electron

This modification to the technique of epi-illumination light microscopy makes use of a new system of lenses that replaces expensive and not readily available dipping cone objectives. The newer objectives offer at least comparable resolution and depth of field, along with simple preparation procedures. An epi-illumination system is a good intermediate between the stereo microscope and a scanning electron microscope, offering magnification at high power that can aid in evaluation of potential scanning electron microscope specimens, as well as the time- and material-saving feature of being able to eliminate unsuitable scanning electron microscope specimens. Key words: technique, epi-illumination, morphogenesis, vegetative apex, primordium, staining.

“Interpretation of Micrographs from a Scanning Electron Microscope”

1969 ◽  
Vol 27 ◽  
pp. 22-23
Author(s):  
E. Eichen ◽  
D. R. Fitchmun ◽  
L. R. Sefton
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Rough Surface ◽  
Great Increase ◽  
Depth Of Field ◽  
Specimen Preparation ◽  
The Past ◽  
The World ◽  
Voltage Contrast ◽  
Scanning Electron

In the past two years, there has been a great increase in interest in the scanning electron microscope as a research tool. Coupled with this has been a large increase in the number of instruments being used throughout the world. The reasons for this popularity stems from the unique abilities of this form of in strumentation which include: (a) a large depth of field which allows one to view a very rough surface; (b) a minimal requirement of specimen preparation; and (c) its ability to make use of voltage contrast in the study of semiconductors.

Scanning Electron Microscopy of Human Bone Marrow

1969 ◽  
Vol 27 ◽  
pp. 52-53
Author(s):  
S. Trubowitz ◽  
A. Broers ◽  
R. F. W. Pease
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Bone Marrow ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Depth Of Field ◽  
Osmic Acid ◽  
Directed Attention ◽  
Aluminum Specimen ◽  
Scanning Electron

Limitation of both depth of field and resolution of the light microscope directed attention to the scanning electron microscope in the examination of the structural and organizational details of the human marrow. Particles of marrow tissure, obtained by aspiration from the sternum, were rapidly separated from the aspirate,, fixed in 6.75% ice-cold glutaraldehyde for ten minutes and post fixed in 1% buffered osmic acid for 30 minutes. The particles were placed on aluminum specimen stubs, coated with a few hundred angstroms of aluminum and then inserted in the microscope for examination.

Scanning electron microscopy and photomicrography

1989 ◽  
Vol 4 ◽  
pp. 351-355
Author(s):  
Walter C. Sweet
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Great Depth ◽  
Depth Of Field ◽  
Structure And Morphology ◽  
Wide Range ◽  
General Aspects ◽  
Scanning Electron

In the last two decades, scanning electron miocroscopy has come to be the technique of choice in studies of microfossil structure and morphology. Scanning electron microscope (SEM) photomicrographs are easy to produce, have great depth of field, and resolve minute details over a wide range of magnifications. Hence photomicrographs of images produced in a SEM are now more widely used than ordinary photographs in the illustration of microfossils. Techniques for preparation, mounting and manipulation of specimens in the SEM vary with the instrument available, aims of the study, and skill of the operator. Hence attention is directed here primarily to general aspects of SEM technique.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

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