scholarly journals Monte Carlo simulation of a Knudsen effusion mass spectrometer sampling system

2017 ◽  
Vol 31 (12) ◽  
pp. 1041-1046 ◽  
Author(s):  
Michael J. Radke ◽  
Nathan S. Jacobson ◽  
Evan H. Copland
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Mass Spectrometer ◽  
Sampling System ◽  
Knudsen Effusion ◽  
Mass Spectrometer Sampling

One-way Leak in Mass Spectrometer Sampling System

1987 ◽  
Vol 67 (4) ◽  
pp. 606-606 ◽  
Author(s):  
Robert F. Koebert ◽  
Richard Munster
Keyword(s):  
Mass Spectrometer ◽  
Sampling System ◽  
Mass Spectrometer Sampling

Gas Phase Interactions between Triethylindium and Trimethylgallium

1988 ◽  
Vol 131 ◽  
Author(s):  
P. D. Agnello ◽  
S. K. Ghandhi
Keyword(s):  
Gas Phase ◽  
Mass Spectrometer ◽  
Vapor Phase ◽  
Room Temperature ◽  
Low Pressure ◽  
Addition Compound ◽  
Sampling System ◽  
Mass Spectrometer Sampling

ABSTRACTA study of the room temperature gas-phase interactions between gallium and indium alkyls was undertaken using a mass spectrometer sampling system, mounted on a low pressure organometallic vapor phase epitaxial reactor. Mixtures of triethylindium with triethylgallium or trimethylgallium were investigated. Both combinations formed addition compounds; moreover, the triethylindium-trimethylgallium mixture underwent alkyl exchange. Both admixtures showed reduced reactivity towards arsine. A structure for the addition compound is proposed.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

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