Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions

2008 ◽  
Vol 22 (10) ◽  
pp. 1481-1496 ◽  
Author(s):  
Roel De Mondt ◽  
Luc Van Vaeck ◽  
Andreas Heile ◽  
Heinrich F. Arlinghaus ◽  
Nicolas Nieuwjaer ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Yield Improvement ◽  
Ion Mass Spectrometry ◽  
Primary Ions ◽  
Secondary Ion

Molecular surface analysis by TOF-SIMS

1992 ◽  
Vol 50 (2) ◽  
pp. 1556-1557
Author(s):  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Molecular Surface ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Static Conditions ◽  
Primary Ions ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2. Since typical solid surfaces have an atomic density of 1015 atoms/cm2, this primary ion dose nominally removes less than 0.1% of a monolayer. Hence, SIMS analyses performed under these static conditions represent near surface analysis in which secondary ions are produced from the top few monolayers of the surface. The actual sampling depth is determined by the primary ion momentum, angle of incidence and chemistry of the surface. Since low dose primary ions cause minimal perturbation of the chemistry of the solid surface, SSIMS analyses often produce molecular or pseudo-molecular ions characteristic of the chemical composition of the surface. Thus, molecular ions or structurally significant fragment ions are often observed in SSIMS analyses of surfaces containing inorganic and organic residues, polymers surfaces, coatings, and biological materials such as tissues and membranes.

Secondary ion mass spectrometry of sodium nitrate: comparison of ReO4− and Cs+ primary ions

1997 ◽  
Vol 163 (3) ◽  
pp. 185-195 ◽  
Author(s):  
G.S. Groenewold ◽  
J.E. Delmore ◽  
J.E. Olson ◽  
A.D. Appelhans ◽  
J.C. Ingram ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Sodium Nitrate ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Primary Ions ◽  
Secondary Ion

Detection of lithium in scalp hair by time-of-flight secondary ion mass spectrometry with high energy (MeV) primary ions

2017 ◽  
Vol 9 (36) ◽  
pp. 5249-5253 ◽  
Author(s):  
Karen J. Cloete ◽  
Boštjan Jenčič ◽  
Žiga Šmit ◽  
Mitja Kelemen ◽  
Kwezikazi Mkentane ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Scalp Hair ◽  
Time Of Flight ◽  
High Energy ◽  
Ion Mass Spectrometry ◽  
Primary Ions ◽  
Secondary Ion

The application of MeV-SIMS is presented for the detection and mapping of lithium in chemically unprocessed, longitudinally sectioned scalp hair.

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