Identification of lattice defects in Cu thin films by positron annihilation spectroscopy

2007 ◽  
Vol 4 (10) ◽  
pp. 3550-3553 ◽  
Author(s):  
Masataka Mizuno ◽  
Teruo Kihara ◽  
Hideki Araki ◽  
Yasuharu Shirai ◽  
Takashi Onishi
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Lattice Defects

scholarly journals Photochromic YOxHy Thin Films Examined by in situ Positron Annihilation Spectroscopy

2020 ◽  
Vol 137 (2) ◽  
pp. 205-208 ◽  
Author(s):  
S.W.H. Eijt ◽  
T.W.H. de Krom ◽  
D. Chaykina ◽  
H. Schut ◽  
G. Colombi ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy

Photoluminescence and positron annihilation spectroscopy of MeV Si+ ion-irradiated SiyO1−y:Er (y≈1/3) thin films

2009 ◽  
Vol 105 (5) ◽  
pp. 053517
Author(s):  
D. E. Blakie ◽  
O. H. Y. Zalloum ◽  
J. Wojcik ◽  
E. A. Irving ◽  
A. P. Knights ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy

Study of nitrogen implanted amorphous hydrogenated carbon thin films by variable-energy positron annihilation spectroscopy

1997 ◽  
Vol 81 (5) ◽  
pp. 2451-2453 ◽  
Author(s):  
F. L. Freire ◽  
D. F. Franceschini ◽  
R. S. Brusa ◽  
G. R. Karwasz ◽  
G. Mariotto ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Carbon Thin Films ◽  
Amorphous Hydrogenated Carbon ◽  
Variable Energy

Tunable monoenergy positron annihilation spectroscopy of polyethylene glycol thin films

2017 ◽  
Vol 26 (5) ◽  
pp. 057802 ◽  
Author(s):  
Peng Kuang ◽  
Xiao-Long Han ◽  
Xing-Zhong Cao ◽  
Rui Xia ◽  
Peng Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Polyethylene Glycol ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy

scholarly journals Ga vacancies and electrical compensation in β-Ga2O3 thin films studied with positron annihilation spectroscopy

2019 ◽  
Author(s):  
Ilja Makkonen ◽  
Antti Karjalainen ◽  
Vera Prozheeva ◽  
Gunter Wagner ◽  
Michele Baldini ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy

Study of Pore Architecture in Silicon Oxide Thin Films by Variable-energy Positron Annihilation Spectroscopy

2002 ◽  
Vol 751 ◽  
Author(s):  
Kenji Ito ◽  
Yoshinori Kobayashi ◽  
Runsheng Yu ◽  
Kouichi Hirata ◽  
Hisashi Togashi ◽  
...  
Keyword(s):  
Thin Films ◽  
Porous Silicon ◽  
Integrated Circuits ◽  
Positron Annihilation ◽  
Large Scale ◽  
Silicon Oxide ◽  
Positron Annihilation Spectroscopy ◽  
Oxide Thin Films ◽  
Intensive Investigation ◽  
Variable Energy

ABSTRACTApplication of porous silicon oxide thin films to nanotechnology is under intensive investigation. Introducing a large amount of nano pores into a silicon oxide matrix is important to develop low-k dielectrics for future ultra-large-scale integrated circuits (ULSI). In this work, we applied variable-energy positron annihilation to the characterization of porous silicon oxide thin films fabricated on silicon wafers by sputtering and spincoating. It was found that the sputtered film has higher open pore connectivity than that of the spincoated low-k film.

scholarly journals Point defects in BaSi2 thin films for photovoltaic applications studied by positron annihilation spectroscopy

2020 ◽  
Vol 127 (8) ◽  
pp. 085304 ◽  
Author(s):  
A. Montes ◽  
S. W. H. Eijt ◽  
Y. Tian ◽  
R. Gram ◽  
H. Schut ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Point Defects ◽  
Positron Annihilation Spectroscopy ◽  
Photovoltaic Applications
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