scholarly journals Characterization of Enzymatically Synthesized Titania Thin Films Using Positron Annihilation Spectroscopy Reveals Low‐Cost Approach for Organic/Inorganic Photovoltaic Cells

2020 ◽  
Vol 4 (6) ◽  
pp. 2000003
Author(s):  
Edward F. Amelrooij ◽  
Henk Schut ◽  
Werner Egger ◽  
Marcel Dickmann ◽  
Christoph Hugenschmidt ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Low Cost ◽  
Photovoltaic Cells ◽  
Positron Annihilation Spectroscopy ◽  
Cost Approach

Characterization of ethylcellulose free films by positron annihilation spectroscopy and mechanical testing

2014 ◽  
Vol 115 ◽  
pp. 47-50 ◽  
Author(s):  
Diána Hegyesi ◽  
Károly Süvegh ◽  
András Kelemen ◽  
Klára Pintye-Hódi ◽  
Géza Regdon
Keyword(s):  
Positron Annihilation ◽  
Mechanical Testing ◽  
Positron Annihilation Spectroscopy ◽  
Free Films

scholarly journals Free-volume Characterization of Polysilanes Using Positron Annihilation Spectroscopy.

1999 ◽  
Vol 12 (5) ◽  
pp. 739-742
Author(s):  
Mutsumi Tashiro ◽  
Shu Seki ◽  
Pradeep K. Pujari ◽  
Yoshihide Honda ◽  
Seiichi Tagawa
Keyword(s):  
Positron Annihilation ◽  
Free Volume ◽  
Positron Annihilation Spectroscopy

scholarly journals Photochromic YOxHy Thin Films Examined by in situ Positron Annihilation Spectroscopy

2020 ◽  
Vol 137 (2) ◽  
pp. 205-208 ◽  
Author(s):  
S.W.H. Eijt ◽  
T.W.H. de Krom ◽  
D. Chaykina ◽  
H. Schut ◽  
G. Colombi ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy

scholarly journals Characterization of Electrodeposited Cadmium Selenide Thin Films

2012 ◽  
Vol 60 (1) ◽  
pp. 137-140 ◽  
Author(s):  
RI Chowdhury ◽  
MS Islam ◽  
F Sabeth ◽  
G Mustafa ◽  
SFU Farhad ◽  
...  
Keyword(s):  
Thin Films ◽  
Cadmium Selenide ◽  
Low Cost ◽  
X Ray Diffraction ◽  
Glass Substrates ◽  
Cdse Film ◽  
Cell Structures ◽  
Deposited Film ◽  
Deposited Films

Cadmium selenide (CdSe) thin films have been deposited on glass/conducting glass substrates using low-cost electrodeposition method. X-ray diffraction (XRD) technique has been used to identify the phases present in the deposited films and observed that the deposited films are mainly consisting of CdSe phases. The photoelectrochemical (PEC) cell measurements indicate that the CdSe films are n-type in electrical conduction, and optical absorption measurements show that the bandgap for as-deposited film is estimated to be 2.1 eV. Upon heat treatment at 723 K for 30 min in air the band gap of CdSe film is decreased to 1.8 eV. The surface morphology of the deposited films has been characterized using scanning electron microscopy (SEM) and observed that very homogeneous and uniform CdSe film is grown onto FTO/glass substrate. The aim of this work is to use n-type CdSe window materials in CdTe based solar cell structures. The results will be presented in this paper in the light of observed data.DOI: http://dx.doi.org/10.3329/dujs.v60i1.10352  Dhaka Univ. J. Sci. 60(1): 137-140 2012 (January)

scholarly journals Microstructural characterization of alumina–zirconia layered ceramics using positron annihilation spectroscopy

2010 ◽  
Vol 58 (8) ◽  
pp. 3014-3021 ◽  
Author(s):  
P. Parente ◽  
Y. Ortega ◽  
B. Savoini ◽  
M.A. Monge ◽  
A. Tucci ◽  
...  
Keyword(s):  
Positron Annihilation ◽  
Microstructural Characterization ◽  
Positron Annihilation Spectroscopy ◽  
Layered Ceramics

Characterization of helium-vacancy complexes in He-ions implanted Fe9Cr by using positron annihilation spectroscopy

2018 ◽  
Vol 505 ◽  
pp. 69-72 ◽  
Author(s):  
Te Zhu ◽  
Shuoxue Jin ◽  
Peng Zhang ◽  
Ligang Song ◽  
Xiangyu Lian ◽  
...  
Keyword(s):  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy

Microstructure characterization of rapidly solidified Al–Fe–Cr–Ce alloy by positron annihilation spectroscopy

2011 ◽  
Vol 509 (7) ◽  
pp. 3211-3218 ◽  
Author(s):  
Alena Michalcová ◽  
Dalibor Vojtěch ◽  
Jakub Čížek ◽  
Ivan Procházka ◽  
Jan Drahokoupil ◽  
...  
Keyword(s):  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy ◽  
Microstructure Characterization ◽  
Rapidly Solidified

Photoluminescence and positron annihilation spectroscopy of MeV Si+ ion-irradiated SiyO1−y:Er (y≈1/3) thin films

2009 ◽  
Vol 105 (5) ◽  
pp. 053517
Author(s):  
D. E. Blakie ◽  
O. H. Y. Zalloum ◽  
J. Wojcik ◽  
E. A. Irving ◽  
A. P. Knights ◽  
...  
Keyword(s):  
Thin Films ◽  
Positron Annihilation ◽  
Positron Annihilation Spectroscopy

scholarly journals Characterization of point defects in CdTe by positron annihilation spectroscopy

2016 ◽  
Vol 108 (24) ◽  
pp. 242102 ◽  
Author(s):  
M. R. M. Elsharkawy ◽  
G. S. Kanda ◽  
E. E. Abdel-Hady ◽  
D. J. Keeble
Keyword(s):  
Positron Annihilation ◽  
Point Defects ◽  
Positron Annihilation Spectroscopy
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