Temperature‐Dependent Local Structural Changes of Amorphous Thin Ge
20
Te
80
Film Revealed by In Situ Resistance, X‐Ray Diffraction, and Raman Spectroscopy Studies
Keyword(s):
X Ray
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2003 ◽
Vol 13
(12)
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pp. 3017-3020
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2018 ◽
Vol 122
(20)
◽
pp. 10992-10998
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2014 ◽
Vol 70
(a1)
◽
pp. C94-C94
Combined in situ X-ray diffraction and Raman spectroscopy on majoritic garnet inclusions in diamonds
2002 ◽
Vol 198
(3-4)
◽
pp. 485-493
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2014 ◽
Vol 54
(6)
◽
pp. 1799-1802
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