Transparent, conductive bulk GaN by high temperature ammonothermal growth

2015 ◽  
Vol 252 (5) ◽  
pp. 1069-1074 ◽  
Author(s):  
Wenkan Jiang ◽  
Dirk Ehrentraut ◽  
Jonathan Cook ◽  
Derrick S. Kamber ◽  
Rajeev T. Pakalapati ◽  
...  
2002 ◽  
Vol 246 (3-4) ◽  
pp. 244-251 ◽  
Author(s):  
T.H Myers ◽  
B.L VanMil ◽  
L.J Holbert ◽  
C.Y Peng ◽  
C.D Stinespring ◽  
...  

1998 ◽  
Vol 537 ◽  
Author(s):  
C.T. Foxon ◽  
T.S. Cheng ◽  
D. Korakakis ◽  
S.V. Novikov ◽  
R.P. Campion ◽  
...  

AbstractVarious methods have been used to initiate growth by Molecular Beam Epitaxy (MBE) of GaN on sapphire, or other substrates, but there is always a problem with morphology and with a high defect density which results in the formation of a sub-grain boundary structure. We show that by using, homo-epitaxial growth on properly prepared bulk GaN substrates, combined with high temperature growth, we obtain a significant improvement in surface morphology. Growth at sufficiently high temperature leads to a rapid smoothing of the surface and to almost atomically flat surfaces over relatively large areas. Multi-Quantum Well structures grown on such GaN epitaxial films are dislocation free with abrupt interfaces.


2015 ◽  
Vol 15 (8) ◽  
pp. 4104-4109 ◽  
Author(s):  
Johannes K. Zettler ◽  
Christian Hauswald ◽  
Pierre Corfdir ◽  
Mattia Musolino ◽  
Lutz Geelhaar ◽  
...  

2021 ◽  
Vol 2021 (HiTEC) ◽  
pp. 000058-000063
Author(s):  
John Harris ◽  
David Huitink ◽  
Dan Ewing

Abstract Gallium nitride (GaN) is a wide band gap semi-conductor with superior electron mobility to silicon carbide. These properties allow for the design of high temperature capable devices with excellent on resistance and breakdown voltage for their size. However, bulk GaN is difficult to fabricate and doping for field effect transistor (FET) control has been elusive, so vertical GaN devices are not commonplace. This paper measures the characteristics of vertical GaN FETs in the development stage and discusses packaging them for fabrication feedback and for future high temperature aplications.


2016 ◽  
Vol 449 ◽  
pp. 35-42 ◽  
Author(s):  
B. Sadovyi ◽  
A. Nikolenko ◽  
J.L. Weyher ◽  
I. Grzegory ◽  
I. Dziecielewski ◽  
...  

1999 ◽  
Vol 4 (S1) ◽  
pp. 484-489 ◽  
Author(s):  
C.T. Foxon ◽  
T.S. Cheng ◽  
D. Korakakis ◽  
S.V. Novikov ◽  
R.P. Campion ◽  
...  

Various methods have been used to initiate growth by Molecular Beam Epitaxy (MBE) of GaN on sapphire, or other substrates, but there is always a problem with morphology and with a high defect density which results in the formation of a sub-grain boundary structure. We show that by using, homo-epitaxial growth on properly prepared bulk GaN substrates, combined with high temperature growth, we obtain a significant improvement in surface morphology. Growth at sufficiently high temperature leads to a rapid smoothing of the surface and to almost atomically flat surfaces over relatively large areas. Multi-Quantum Well structures grown on such GaN epitaxial films are dislocation free with abrupt interfaces.


2008 ◽  
Vol 310 (17) ◽  
pp. 3907-3910 ◽  
Author(s):  
Tadao Hashimoto ◽  
Feng Wu ◽  
James S. Speck ◽  
Shuji Nakamura

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