Polarized Raman study of self-assembled Ge/Si dots under hydrostatic pressure

2009 ◽  
Vol 246 (3) ◽  
pp. 482-485 ◽  
Author(s):  
J. S. Reparaz ◽  
A. Bernardi ◽  
A. R. Goñi ◽  
M. I. Alonso ◽  
M. Garriga
1999 ◽  
Vol 581 ◽  
Author(s):  
S. Gupta ◽  
R. S. Katiyar ◽  
R. Guo ◽  
A. S. Bhalla

ABSTRACTRelaxor ferroelectrics are one of the important classes of self-assembled nanostructure composite materials. Interesting features associated with the nanoregions give rise to the most interesting device related characteristics and unusual properties in these materials. Besides, they possess the largest property coefficients by themselves or when modified with lead titanate (PT). In this report, a detailed temperature dependent study has been carried out on (1-x)PZN-xPT relaxors with compositions x = 0.05 and 0.085 using polarized Raman scattering under optical and E-field variables and inferred the structure-property relations in order to obtain information to characterize the material for matching the application criteria. In addition, phase transitions associated with the relaxors have also been investigated to understand the polarization mechanism(s) for the unpoled and poled specimens.


1993 ◽  
Vol 3 (4) ◽  
pp. 1007-1029 ◽  
Author(s):  
M. Krauzman ◽  
A. Colline ◽  
D. Kirin ◽  
R. M. Pick ◽  
N. Toupry

2011 ◽  
Vol 248 (5) ◽  
pp. 1154-1157 ◽  
Author(s):  
Bo Liu ◽  
Bingbing Liu ◽  
Quanjun Li ◽  
Zepeng Li ◽  
Mingguang Yao ◽  
...  

2000 ◽  
Vol 61 (20) ◽  
pp. 13785-13790 ◽  
Author(s):  
D. A. Tenne ◽  
V. A. Haisler ◽  
A. I. Toropov ◽  
A. K. Bakarov ◽  
A. K. Gutakovsky ◽  
...  
Keyword(s):  

2018 ◽  
Vol 63 (9) ◽  
pp. 1311-1315 ◽  
Author(s):  
A. Krylov ◽  
S. Krylova ◽  
S. Kopyl ◽  
A. Kholkin

RSC Advances ◽  
2015 ◽  
Vol 5 (69) ◽  
pp. 55795-55800 ◽  
Author(s):  
Adrien Lignie ◽  
Patrick Hermet ◽  
Guillaume Fraysse ◽  
Pascale Armand

Raman lines due to Ge–O–Si bridges in α-Ge1−xSixO2 single crystals are identified with the help of polarized Raman and calculations.


2011 ◽  
Vol 380 (1-3) ◽  
pp. 24-33 ◽  
Author(s):  
Dheeraj K. Singh ◽  
Sunil K. Srivastava ◽  
Birendra P. Asthana

1991 ◽  
Vol 220 ◽  
Author(s):  
Zhifeng Sui ◽  
Irving P. Herman ◽  
Joze Bevk

ABSTRACTThe effects of strain and confinement on optical phonons in a Si12Ge4 strained layer superlattice grown by MBE on c-Si (001) were studied as a function of hydrostatic pressure (T = 295 K) using Raman scattering. The change of phonon frequency with pressure, dω/dP, for the principal quasi-confined LO mode in the Ge layers is found to be significantly smaller than that for bulk crystalline Ge because the magnitude of biaxial strain decreases in the Ge layers with added pressure and because the Grüneisen parameter of the confined mode is smaller than that of the Γ-point optical phonon. More generally, it is noted that the magnitude of biaxial strain in many strained layer superlattices initially decreases with the application of hydrostatic pressure, making the structures more stable.


Sign in / Sign up

Export Citation Format

Share Document