Raman and transmission electron microscopy characterization of InN samples grown on GaN/Al2O3 by molecular beam epitaxy

2006 ◽  
Vol 243 (7) ◽  
pp. 1588-1593 ◽  
Author(s):  
J. Arvanitidis ◽  
M. Katsikini ◽  
S. Ves ◽  
A. Delimitis ◽  
Th. Kehagias ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Transmission Electron ◽  
Transmission Electron Microscopy Characterization ◽  
Microscopy Characterization

Transmission Electron Microscopy Characterization of Position-Controlled InN Nanocolumns

2008 ◽  
Vol 47 (7) ◽  
pp. 5330-5332 ◽  
Author(s):  
Satoshi Harui ◽  
Hidetoshi Tamiya ◽  
Takanobu Akagi ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Transmission Electron Microscopy Characterization ◽  
Microscopy Characterization
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