Metallurgical study of Ni/(Ga,Al) As contacts. III. Transmission electron microscopy characterization of ternary superstructured phases in the reacted layers

1991 ◽  
Vol 70 (12) ◽  
pp. 7613-7619 ◽  
Author(s):  
A. Poudoulec ◽  
B. Guenais ◽  
A. Guivarc’h ◽  
J. Caulet ◽  
R. Guérin
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Transmission Electron Microscopy Characterization ◽  
Metallurgical Study ◽  
Microscopy Characterization

Transmission Electron Microscopy Characterization of Position-Controlled InN Nanocolumns

2008 ◽  
Vol 47 (7) ◽  
pp. 5330-5332 ◽  
Author(s):  
Satoshi Harui ◽  
Hidetoshi Tamiya ◽  
Takanobu Akagi ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Transmission Electron Microscopy Characterization ◽  
Microscopy Characterization
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