Some physical properties and point defects in Bi2-xInxTe3 mixed crystals

1983 ◽  
Vol 76 (1) ◽  
pp. K71-K75 ◽  
Author(s):  
P. Lošťák ◽  
J. Horák ◽  
L. Koudelka
1984 ◽  
Vol 84 (2) ◽  
pp. K143-K147 ◽  
Author(s):  
P. Lošť??k ◽  
J. Horák ◽  
L. Koudelka

1986 ◽  
Vol 28 (2) ◽  
pp. 103-113
Author(s):  
Toshiaki IKOMA ◽  
Yasunori MOCHIZUKI

2011 ◽  
Vol 75 (12) ◽  
pp. 657-664 ◽  
Author(s):  
Manabu Nishimoto ◽  
Kozo Nakamura ◽  
Masataka Hourai ◽  
Toshiaki Ono ◽  
Wataru Sugimura ◽  
...  

2022 ◽  
Vol 2155 (1) ◽  
pp. 012012
Author(s):  
V I Chepurnov ◽  
M V Dolgopolov ◽  
A V Gurskaya ◽  
G V Puzyrnaya ◽  
D E Elkhimov

Abstract The authors consider heterostructures of silicon carbide obtained during endotaxy on silicon substrates. The question is raised in connection with the description of the endotaxy process itself at the structural level. Authors focus on the technological aspects of the formation of a stable β-SiC/Si heterostructure by endotaxy in relation to the evolution of point defects of various nature and their probable association models with the participation of a radionuclide impurity at the micro-alloying level: 1) the growth of the SiC*/Si thin layer with C-14 atoms in the doping process; 2) physical properties of defects formation; 3) some interface between properties and efficiency.


2019 ◽  
Vol 21 (20) ◽  
pp. 10552-10566 ◽  
Author(s):  
Asadollah Bafekry ◽  
Mitra Ghergherehchi ◽  
Saber Farjami Shayesteh

Defects are inevitably present in materials, and their existence in a material strongly affects its fundamental physical properties.


2007 ◽  
Vol 101 (4) ◽  
pp. 044906 ◽  
Author(s):  
Keith L. Duncan ◽  
Yanli Wang ◽  
Sean R. Bishop ◽  
Fereshteh Ebrahimi ◽  
Eric D. Wachsman

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