Limitations for Reliable Operation at Elevated Temperatures of Al
2
O
3
/AlGaN/GaN Metal–Insulator–Semiconductor High‐Electron‐Mobility Transistors Grown by Metal‐Organic Chemical Vapor Deposition on Silicon Substrate
1993 ◽
Vol 32
(Part 1, No. 12A)
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pp. 5508-5513
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2006 ◽
Vol 24
(6)
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pp. 2597
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2016 ◽
Vol 33
(10)
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pp. 108104
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