Morphology and orientation during the deformation of segmented elastomers studied with small-angle X-ray scattering and atomic force microscopy

2002 ◽  
Vol 40 (16) ◽  
pp. 1727-1740 ◽  
Author(s):  
Bryan B. Sauer ◽  
R. Scott McLean ◽  
Donald J. Brill ◽  
David J. Londono
Keyword(s):  
Atomic Force Microscopy ◽  
Small Angle ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Microstructure Determination of AOT + Phenol Organogels Utilizing Small-Angle X-ray Scattering and Atomic Force Microscopy

2001 ◽  
Vol 123 (10) ◽  
pp. 2414-2421 ◽  
Author(s):  
Blake A. Simmons ◽  
Chad E. Taylor ◽  
Forrest A. Landis ◽  
Vijay T. John ◽  
Gary L. McPherson ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Small Angle ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Ordering of self-assembledSi1−xGexislands studied by grazing incidence small-angle x-ray scattering and atomic force microscopy

1998 ◽  
Vol 58 (16) ◽  
pp. 10523-10531 ◽  
Author(s):  
M. Schmidbauer ◽  
Th. Wiebach ◽  
H. Raidt ◽  
M. Hanke ◽  
R. Köhler ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

1999 ◽  
Vol 38 (4) ◽  
pp. 684 ◽  
Author(s):  
Victor E. Asadchikov ◽  
Angela Duparré ◽  
Stefan Jakobs ◽  
Albert Yu. Karabekov ◽  
Igor V. Kozhevnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
X Ray ◽  
Force Microscopy ◽  
Optical Surfaces ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering
Sign in / Sign up

Export Citation Format

Share Document