Ordering of self-assembledSi1−xGexislands studied by grazing incidence small-angle x-ray scattering and atomic force microscopy

1998 ◽  
Vol 58 (16) ◽  
pp. 10523-10531 ◽  
Author(s):  
M. Schmidbauer ◽  
Th. Wiebach ◽  
H. Raidt ◽  
M. Hanke ◽  
R. Köhler ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Microstructure Determination of AOT + Phenol Organogels Utilizing Small-Angle X-ray Scattering and Atomic Force Microscopy

2001 ◽  
Vol 123 (10) ◽  
pp. 2414-2421 ◽  
Author(s):  
Blake A. Simmons ◽  
Chad E. Taylor ◽  
Forrest A. Landis ◽  
Vijay T. John ◽  
Gary L. McPherson ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Small Angle ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Nanometer surface gratings on Si(100) characterized by x-ray scattering under grazing incidence and atomic force microscopy

1997 ◽  
Vol 81 (3) ◽  
pp. 1212-1216 ◽  
Author(s):  
T. H. Metzger ◽  
K. Haj-Yahya ◽  
J. Peisl ◽  
M. Wendel ◽  
H. Lorenz ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Grazing Incidence ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering
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