Synthesis and characterization of materials prepared via the copolymerization of ethylene with 1-octadecene and norbornene using a [(π-cyano-nacnac)Cp] zirconium complex

2011 ◽  
Vol 49 (7) ◽  
pp. 1535-1542 ◽  
Author(s):  
Alan R. Cabrera ◽  
Yanika Schneider ◽  
Mauricio Valderrama ◽  
Griselda B. Galland ◽  
Rene S. Rojas
Keyword(s):  
Synthesis And Characterization ◽  
Zirconium Complex ◽  
Characterization Of Materials

Synthesis and Characterization of a Zirconium Complex Containing a Corannulene-Based Ligand

2002 ◽  
Vol 21 (10) ◽  
pp. 2027-2029 ◽  
Author(s):  
Robert M. Chin ◽  
Michael S. Jarosh ◽  
Jason D. Russell ◽  
Rene J. Lachicotte
Keyword(s):  
Synthesis And Characterization ◽  
Zirconium Complex

Synthesis and solution behaviour of dual light- and temperature-responsive poly(triethylene glycol-co-spiropyran) copolymers and block copolymers

2019 ◽  
Vol 10 (21) ◽  
pp. 2674-2685 ◽  
Author(s):  
Oliver Grimm ◽  
Sarina C. Maßmann ◽  
Felix H. Schacher
Keyword(s):  
Block Copolymers ◽  
Triethylene Glycol ◽  
Synthesis And Characterization ◽  
Temperature Responsive ◽  
Dual Responsive ◽  
Characterization Of Materials ◽  
Solution Behaviour

We herein report on the synthesis and characterization of materials featuring a dual-responsive copolymer segment consisting of photo-responsive spiropyran (SPA) and temperature-responsive triethylene glycol acrylate (TEGA).

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

Applications of ultramicrotomy for materials characterization

1993 ◽  
Vol 51 ◽  
pp. 232-233
Author(s):  
R.T. Blackham ◽  
J.J. Haugh ◽  
C.W. Hughes ◽  
M.G. Burke
Keyword(s):  
Materials Science ◽  
Microstructural Analysis ◽  
Analytical Electron Microscopy ◽  
Austenitic Stainless Steels ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Thermally Induced ◽  
Radiation Induced ◽  
Characterization Of Materials

Essential to the characterization of materials using analytical electron microscopy (AEM) techniques is the specimen itself. Without suitable samples, detailed microstructural analysis is not possible. Ultramicrotomy, or diamond knife sectioning, is a well-known mechanical specimen preparation technique which has been gaining attention in the materials science area. Malis and co-workers and Glanvill have demonstrated the usefulness and applicability of this technique to the study of a wide variety of materials including Al alloys, composites, and semiconductors. Ultramicrotomed specimens have uniform thickness with relatively large electron-transparent areas which are suitable for AEM anaysis.Interface Analysis in Type 316 Austenitic Stainless Steel: STEM-EDS microanalysis of grain boundaries in austenitic stainless steels provides important information concerning the development of Cr-depleted zones which accompany M23C6 precipitation, and documentation of radiation induced segregation (RIS). Conventional methods of TEM sample preparation are suitable for the evaluation of thermally induced segregation, but neutron irradiated samples present a variety of problems in both the preparation and in the AEM analysis, in addition to the handling hazard.

Synthesis and Characterization of the Three Dicyclopentapyrenes

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula
Keyword(s):  
Synthesis And Characterization
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