Optical characterization of three-dimensional surface and bulk anisotropy in high refractive index polymers

1992 ◽  
Vol 32 (18) ◽  
pp. 1358-1365 ◽  
Author(s):  
Cheol Y. Cha ◽  
Samir Moghazy ◽  
Robert J. Samuels
Keyword(s):  
Refractive Index ◽  
Three Dimensional ◽  
Optical Characterization ◽  
High Refractive Index ◽  
Bulk Anisotropy ◽  
Dimensional Surface

scholarly journals Three-dimensional surface profiling and optical characterization of liquid microlens using a Shack–Hartmann wave front sensor

2011 ◽  
Vol 98 (17) ◽  
pp. 171104 ◽  
Author(s):  
Chenhui Li ◽  
Gunnsteinn Hall ◽  
Xuefeng Zeng ◽  
Difeng Zhu ◽  
Kevin Eliceiri ◽  
...  
Keyword(s):  
Wave Front ◽  
Three Dimensional ◽  
Optical Characterization ◽  
Surface Profiling ◽  
Dimensional Surface

Preparation and Characterization of Polyvinylidene Fluoride/ZrO2-TiO2 Optical Film with Wide Band Gap and High Refractive Index

2013 ◽  
Vol 28 (6) ◽  
pp. 671-676 ◽  
Author(s):  
Yu-Qing ZHANG ◽  
Li-Li ZHAO ◽  
Shi-Long XU ◽  
Chao ZHANG ◽  
Xiao-Ying CHEN ◽  
...  
Keyword(s):  
Refractive Index ◽  
Band Gap ◽  
Polyvinylidene Fluoride ◽  
Wide Band ◽  
High Refractive Index ◽  
Wide Band Gap ◽  
Optical Film

scholarly journals Optical Characterization of AsxTe100−x Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method

Materials ◽  
2020 ◽  
Vol 13 (13) ◽  
pp. 2981 ◽  
Author(s):  
Dorian Minkov ◽  
George Angelov ◽  
Radi Nestorov ◽  
Aleksey Nezhdanov ◽  
Dmitry Usanov ◽  
...  
Keyword(s):  
Refractive Index ◽  
Extinction Coefficient ◽  
Glass Substrate ◽  
Plasma Deposition ◽  
Optical Characterization ◽  
The Other ◽  
Semiconductor Film ◽  
Average Thickness ◽  
Envelope Method

Three AsxTe100−x films with different x and dissimilar average thickness d ¯ are characterized mainly from one interference transmittance spectrum T(λ = 300 to 3000 nm) of such film on a substrate based on the advanced optimizing envelope method (AOEM). A simple dual transformation of T(λ) is proposed and used for increasing the accuracy of computation of its envelopes T+(λ) and T−(λ) accounting for the significant glass substrate absorption especially for λ > 2500 nm. The refractive index n(λ) of As40Te60 and As98Te2 films is determined with a relative error <0.30%. As far as we know, the As80Te20 film is the only one with anomalous dispersion and the thickest, with estimated d ¯ = 1.1446 nm, ever characterized by an envelope method. It is also shown and explained why the extinction coefficient k(λ) of any of the three AsxTe100−x films is computed more accurately from the quantity Ti(λ) = [T+(λ)T−(λ)]0.5 compared to its commonly employed computation from T+(λ). The obtained results strengthen our conviction that the AOEM has a capacity for providing most accurate optical characterization of almost every dielectric or semiconductor film with d ¯ > 300 nm on a substrate, compared to all the other methods for characterization of such films only from T(λ).

Preparation and characterization of ZnS–polymer nanocomposite films with high refractive index

2003 ◽  
Vol 13 (9) ◽  
pp. 2189-2195 ◽  
Author(s):  
Changli Lü ◽  
Zhanchen Cui ◽  
Yao Wang ◽  
Zuo Li ◽  
Cheng Guan ◽  
...  
Keyword(s):  
Refractive Index ◽  
Polymer Nanocomposite ◽  
High Refractive Index ◽  
Nanocomposite Films
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