Reducing glitches when reconstructing four-port S-parameters of differential transmission lines from two-port measurements

2014 ◽  
Vol 56 (10) ◽  
pp. 2257-2260 ◽  
Author(s):  
Daniel M. García-Mora ◽  
Miguel A. Tlaxcalteco-Matus ◽  
Reydezel Torres-Torres ◽  
Gaudencio Hernández-Sosa ◽  
Olga M. Becerra-Fuentes
Keyword(s):  
Transmission Lines ◽  
S Parameters ◽  
Differential Transmission

scholarly journals Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters

2007 ◽  
Vol 5 ◽  
pp. 427-434 ◽  
Author(s):  
T. Zelder ◽  
H. Rabe ◽  
H. Eul
Keyword(s):  
Transmission Lines ◽  
Phase Error ◽  
Measuring System ◽  
Contactless Measurement ◽  
Planar Circuits ◽  
Calibration Methods ◽  
S Parameters ◽  
Coupling Techniques ◽  
Basic Characteristics ◽  
Set Up

Abstract. In this paper, a contactless measuring system for the determination of the S-parameters of planar circuits is presented. With a contactless measuring system it is possible to characterise a device-under-test (DUT) embedded in a planar circuit environment without cutting the planar transmission lines connecting the DUT. The technique utilizes four identical capacitive probes in conjunction with a vector network analyser (VNA). For the usage of electromagnetic probes compared to other coupling techniques like the electro-optic probing, there is no need for expensive and complex equipment in addition to the typical equipment of a common microwave laboratory. The S-parameters are determined accurately using conventional calibration methods. A simple analytical model for the representation of the basic characteristics is developed. Furthermore, the influences on the S-parameters as a result of a variation in the coupling are presented. With the knowledge of the system characteristics, an accurate contactless measurement system is set up. The comparison between conventional and contactless measurements in a frequency range of 1–20 GHz shows a very good agreement with a phase error smaller than 1°.

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