An efficient method for measuring the parameters of single-mode anisotropic slab waveguides using the prism-coupling technique

2005 ◽  
Vol 47 (6) ◽  
pp. 575-580 ◽  
Author(s):  
Fubin Gao ◽  
Guotong Du ◽  
Vannadeth ◽  
Ping Zhang ◽  
Fengyan Lun
Keyword(s):  
Efficient Method ◽  
Single Mode ◽  
Coupling Technique ◽  
Slab Waveguides ◽  
Prism Coupling ◽  
Anisotropic Slab

Investigation on optical properties of Bi2.85La0.15TiNbO9 thin films by prism coupling technique

2009 ◽  
Vol 97 (4) ◽  
pp. 741-744 ◽  
Author(s):  
Mingfu Zhang ◽  
Hengzhi Chen ◽  
Bin Yang ◽  
Wenwu Cao
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Coupling Technique ◽  
Prism Coupling

Optical Waveguides in Thermally Grown SiO2 on Si Using Nitrogen Ion Implantation

1991 ◽  
Vol 244 ◽  
Author(s):  
S. P. Wong ◽  
E. Y. B. Pun ◽  
W. T. Lam ◽  
P. S. Chung
Keyword(s):  
Optical Waveguides ◽  
Nitrogen Concentration ◽  
Silicon Substrates ◽  
Optical Wave ◽  
Implantation Energy ◽  
Coupling Technique ◽  
Waveguide Loss ◽  
Prism Coupling ◽  
Nitrogen Ion ◽  
Thermally Grown

ABSTRACTMulti-energy nitrogen implantation into thermally grown SiO2 on silicon substrates has been performed and the optical wave-guiding properties of this structure has been studied. The implantation energy used was in Ie range of 40 KeV to 150 keV, and the doses used were typically 2×1016 to 2×10−2. The energies and doses were chosen to achieve relatively flat implanted nitrogen profiles. It is found that optical waveguides can be formed when the implanted nitrogen concentration is sufficiently high. Both prism-coupling technique and end-fire coupling technique were used to test the implanted waveguides fabricated. Many m-lines including dark modes were observed by the prism-coupling method. This structure is found to be very stable against thermal annealing and there is no significant change observed in the waveguiding properties even after annealing at 1000 °C for four hours. The waveguide loss was found to be typically 0.6 dB/cm before annealing and can be further reduced to about 0.3 dB/cm after annealing.

Determining thin film parameters by prism coupling technique

2002 ◽  
Vol 28 (6) ◽  
pp. 467-470 ◽  
Author(s):  
A. V. Khomchenko ◽  
A. B. Sotsky ◽  
A. A. Romanenko ◽  
E. V. Glazunov ◽  
D. N. Kostyuchenko
Keyword(s):  
Thin Film ◽  
Coupling Technique ◽  
Prism Coupling
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