Detecting variations of small-signal equivalent-circuit model parameters in the Si/SiGe HBT process with ANN

2004 ◽  
Vol 15 (1) ◽  
pp. 102-108 ◽  
Author(s):  
H. Taher ◽  
D. Schreurs ◽  
R. Gillon ◽  
E. Vestiel ◽  
C. van Niekerk ◽  
...  
IEEE Access ◽  
2019 ◽  
Vol 7 ◽  
pp. 5865-5873
Author(s):  
Yabin Sun ◽  
Ziyu Liu ◽  
Xiaojin Li ◽  
Yanling Shi

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