Detecting variations of small-signal equivalent-circuit model parameters in the Si/SiGe HBT process with ANN
2004 ◽
Vol 15
(1)
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pp. 102-108
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2005 ◽
Vol 152
(6)
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pp. 661
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Keyword(s):
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2015 ◽
Vol 63
(9)
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pp. 2756-2763
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2021 ◽
Vol 2009
(1)
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pp. 012068
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1997 ◽
Vol 45
(1)
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pp. 46-51
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