The surface degradation of Baltic amber: The depth‐profiling analysis and its application to historical object

2020 ◽  
Author(s):  
Anna Rygula ◽  
Anna Klisińska‐Kopacz ◽  
Paulina Krupska ◽  
Elżbieta Kuraś ◽  
Julio M. Hoyo‐Meléndez
Keyword(s):  
Depth Profiling ◽  
Baltic Amber ◽  
Surface Degradation ◽  
Profiling Analysis

SIMS depth profiling analysis of P-doped n-type Si layer to develop the Si QD solar cell

2014 ◽  
Vol 46 (S1) ◽  
pp. 341-343
Author(s):  
Tae Woon Kim ◽  
Hyun Jeong Baek ◽  
Jong Shik Jang ◽  
Seung Mi Lee ◽  
Kyung Joong Kim
Keyword(s):  
Solar Cell ◽  
Depth Profiling ◽  
Profiling Analysis ◽  
Sims Depth Profiling

scholarly journals Measurement of Ion Sputtering Yields for In-depth Profiling Analysis

1991 ◽  
Vol 77 (12) ◽  
pp. 2171-2178 ◽  
Author(s):  
Toshiko SUZUKI ◽  
Kichinosuke HIROKAWA ◽  
Yasuo FUKUDA ◽  
Kenichi SUZUKI ◽  
Satoshi HASHIMOTO ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Ion Sputtering ◽  
Sputtering Yields ◽  
Profiling Analysis

scholarly journals Novel 2D binning approach for advanced LIMS depth profiling analysis

2019 ◽  
Vol 34 (8) ◽  
pp. 1564-1570 ◽  
Author(s):  
Andreas Riedo ◽  
Valentine Grimaudo ◽  
Alena Cedeño López ◽  
Marek Tulej ◽  
Peter Wurz ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Layer By Layer ◽  
Profiling Analysis

Novel layer-by-layer ablation protocol for sensitive chemical depth profiling measurements of micrometer-sized samples.

Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper

2004 ◽  
Vol 19 (5) ◽  
pp. 692 ◽  
Author(s):  
K. Shimizu ◽  
R. Payling ◽  
H. Habazaki ◽  
P. Skeldon ◽  
G. E. Thompson
Keyword(s):  
Depth Profiling ◽  
Profiling Analysis

GDOES depth profiling analysis of a thin surface film on aluminium

1999 ◽  
Vol 27 (11) ◽  
pp. 998-1002 ◽  
Author(s):  
K. Shimizu ◽  
H. Habazaki ◽  
P. Skeldon ◽  
G. E. Thompson ◽  
G. C. Wood
Keyword(s):  
Surface Film ◽  
Depth Profiling ◽  
Profiling Analysis
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